Reference Type | Journal (article/letter/editorial) |
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Title | The electron stationary picture method for high-speed measurement of reflection intensities from crystals with large unit cells |
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Journal | Acta Crystallographica Section A |
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Authors | Xuong, N. H. | Author |
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Freer, S. T. | Author |
Hamlin, R. | Author |
Nielsen, C. | Author |
Vernon, W. | Author |
Year | 1978 (March 1) | Volume | 34 |
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Issue | 2 |
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Publisher | International Union of Crystallography (IUCr) |
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DOI | doi:10.1107/s0567739478000546Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 181639 | Long-form Identifier | mindat:1:5:181639:0 |
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GUID | 0 |
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Full Reference | Xuong, N. H., Freer, S. T., Hamlin, R., Nielsen, C., Vernon, W. (1978) The electron stationary picture method for high-speed measurement of reflection intensities from crystals with large unit cells. Acta Crystallographica Section A, 34 (2) 289-296 doi:10.1107/s0567739478000546 |
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Plain Text | Xuong, N. H., Freer, S. T., Hamlin, R., Nielsen, C., Vernon, W. (1978) The electron stationary picture method for high-speed measurement of reflection intensities from crystals with large unit cells. Acta Crystallographica Section A, 34 (2) 289-296 doi:10.1107/s0567739478000546 |
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In | (1978, March) Acta Crystallographica Section A Vol. 34 (2) International Union of Crystallography (IUCr) |
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