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Chutjian, Ara, Ajello, Joseph M. (1977) Studies of Ar and N2 using threshold photoelectron spectroscopy by electron attachment (TPSA) The Journal of Chemical Physics, 66 (10) 4544-4550 doi:10.1063/1.433709

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Reference TypeJournal (article/letter/editorial)
TitleStudies of Ar and N2 using threshold photoelectron spectroscopy by electron attachment (TPSA)
JournalThe Journal of Chemical Physics
AuthorsChutjian, AraAuthor
Ajello, Joseph M.Author
Year1977 (May 15)Volume66
Issue10
PublisherAIP Publishing
DOIdoi:10.1063/1.433709Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID2108221Long-form Identifiermindat:1:5:2108221:6
GUID0
Full ReferenceChutjian, Ara, Ajello, Joseph M. (1977) Studies of Ar and N2 using threshold photoelectron spectroscopy by electron attachment (TPSA) The Journal of Chemical Physics, 66 (10) 4544-4550 doi:10.1063/1.433709
Plain TextChutjian, Ara, Ajello, Joseph M. (1977) Studies of Ar and N2 using threshold photoelectron spectroscopy by electron attachment (TPSA) The Journal of Chemical Physics, 66 (10) 4544-4550 doi:10.1063/1.433709
In(1977, May) The Journal of Chemical Physics Vol. 66 (10) AIP Publishing

See Also

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Ajello, J. M., Chutjian, A. (1979) Line shapes for attachment of threshold electrons to SF6 and CFCl3: Threshold photoelectron (TPSA) studies of Xe, CO, and C2H2. The Journal of Chemical Physics, 71 (3) 1079-1087 doi:10.1063/1.438473
Ajello, J. M., Chutjian, A. (1976) High‐resolution threshold photoelectron spectroscopy by electron attachment. The Journal of Chemical Physics, 65 (12) 5524-5525 doi:10.1063/1.433011
Chutjian, A., Ajmello, J.M. (1980) Threshold photoelectron spectrum of O2 by electron attachment. Chemical Physics Letters, 72. 504-508 doi:10.1016/0009-2614(80)80341-1
Bernius, Mark T., Chutjian, Ara (1989) Pulsed, high‐current, in‐line reversal electron attachment detector. Journal of Applied Physics, 66 (7). 2783-2788 doi:10.1063/1.344204
Ajello, Joseph M. (1970) Emission Cross Sections of N2 in the Vacuum Ultraviolet by Electron Impact. The Journal of Chemical Physics, 53 (3) 1156-1165 doi:10.1063/1.1674113
Chutjian, A, Alajajian, S H, Ajello, J M, Orient, O J (1984) s-wave threshold in electron attachment: results in 2-C4F6and CFCL3at ultra-low electron energies. Journal of Physics B: Atomic and Molecular Physics, 17. doi:10.1088/0022-3700/17/21/010
Chutjian, Ara (1974) Electron‐impact excitation of the low‐lying electronic states of formaldehyde. The Journal of Chemical Physics, 61 (10) 4279-4284 doi:10.1063/1.1681731
Chutjian, A, Alajajian, S H, Ajello, J M, Orient, O J (1985) s-wave threshold in electron attachment: results in 2-C4F6 and CFCl3 at ultra-low electron energies. Journal of Physics B: Atomic and Molecular Physics, 18. 3025-3026 doi:10.1088/0022-3700/18/14/525
Krenos, J., Bruno, J. Bel (1977) Erratum: Formation of N2 C3Πu and B3Πg metastable Ar with N2. The Journal of Chemical Physics, 66 (12) 5832 doi:10.1063/1.434513
Black, G., Sharpless, R. L., Slanger, T. G. (1975) Collision‐induced emission from O(1S) by He, Ar, N2, H2, Kr, and Xe. The Journal of Chemical Physics, 63 (10) 4546-4550 doi:10.1063/1.431135
Wang, W. C., Lee, L. C. (1986) Electron attachment rate constants of SOCl2 in Ar, N2, and CH4. The Journal of Chemical Physics, 85 (11). 6470-6474 doi:10.1063/1.451427
 
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