Smith, A. D., Schofield, P. F., Cressey, G., Cressey, B. A., Read, P. D. (2004) The development of X-ray photo-emission electron microscopy (XPEEM) for valence-state imaging of mineral intergrowths. Mineralogical Magazine, 68 (6) 859-869 doi:10.1180/0026461046860228
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | The development of X-ray photo-emission electron microscopy (XPEEM) for valence-state imaging of mineral intergrowths | ||
| Journal | Mineralogical Magazine | ||
| Authors | Smith, A. D. | Author | |
| Schofield, P. F. | Author | ||
| Cressey, G. | Author | ||
| Cressey, B. A. | Author | ||
| Read, P. D. | Author | ||
| Year | 2004 (December) | Volume | 68 |
| Issue | 6 | ||
| Publisher | Mineralogical Society | ||
| DOI | doi:10.1180/0026461046860228Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 243584 | Long-form Identifier | mindat:1:5:243584:2 |
| GUID | 0 | ||
| Full Reference | Smith, A. D., Schofield, P. F., Cressey, G., Cressey, B. A., Read, P. D. (2004) The development of X-ray photo-emission electron microscopy (XPEEM) for valence-state imaging of mineral intergrowths. Mineralogical Magazine, 68 (6) 859-869 doi:10.1180/0026461046860228 | ||
| Plain Text | Smith, A. D., Schofield, P. F., Cressey, G., Cressey, B. A., Read, P. D. (2004) The development of X-ray photo-emission electron microscopy (XPEEM) for valence-state imaging of mineral intergrowths. Mineralogical Magazine, 68 (6) 859-869 doi:10.1180/0026461046860228 | ||
| Abstract/Notes | AbstractWe demonstrate the potential of X-ray photo-emission electron microscopy (XPEEM) to reveal valence-state images of the spatial distribution and relative concentration of metals in specific oxidation states. Additionally, XPEEM allows X-ray absorption spectra to be extracted from chosen pixel areas of the images. Using an in-house-built XPEEM instrument we show an application of the method in providing valence-state images of complex mineral intergrowths. The image resolution achieved with this instrument of simple design was ∼5 μm and reasonable quality X-ray absorption spectra were extracted from areas of ∼5×5 μm. These initial results suggest that by using commercial XPEEM instruments on 3rd generation, high-brightness synchrotron sources a spatial resolution of 100 nm or better could be achieved, with the ability to extract high-quality X-ray absorption spectra from areas of 0.1 μm2. Given that standard thin sections or polished blocks can be studied by XPEEM, and that each XPEEM image records ∼1000 μm2, XPEEM can be used in conjunction with other analytical methods such as EMPA and TEM-EELS/PEELS. | ||
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