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Lyeo, H.-K. (2004) Profiling the Thermoelectric Power of Semiconductor Junctions with Nanometer Resolution. Science, 303 (5659). 816-818 doi:10.1126/science.1091600

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Reference TypeJournal (article/letter/editorial)
TitleProfiling the Thermoelectric Power of Semiconductor Junctions with Nanometer Resolution
JournalScience
AuthorsLyeo, H.-K.Author
Year2004 (February 6)Volume303
Issue5659
PublisherAmerican Association for the Advancement of Science (AAAS)
DOIdoi:10.1126/science.1091600Search in ResearchGate
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Mindat Ref. ID2554904Long-form Identifiermindat:1:5:2554904:7
GUID0
Full ReferenceLyeo, H.-K. (2004) Profiling the Thermoelectric Power of Semiconductor Junctions with Nanometer Resolution. Science, 303 (5659). 816-818 doi:10.1126/science.1091600
Plain TextLyeo, H.-K. (2004) Profiling the Thermoelectric Power of Semiconductor Junctions with Nanometer Resolution. Science, 303 (5659). 816-818 doi:10.1126/science.1091600
In(2004, February) Science Vol. 303 (5659) American Association for the Advancement of Science (AAAS)

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