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Black, Kate, Jones, Anthony C., Chalker, Paul R., Gaskell, Jeffrey M., Murray, Robert T., Joyce, Tim B., Rushworth, Simon A. (2008) MOCVD of ZnO thin films for potential use as compliant layers for GaN on Si. Journal of Crystal Growth, 310 (5). 1010-1014 doi:10.1016/j.jcrysgro.2007.11.131

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Reference TypeJournal (article/letter/editorial)
TitleMOCVD of ZnO thin films for potential use as compliant layers for GaN on Si
JournalJournal of Crystal Growth
AuthorsBlack, KateAuthor
Jones, Anthony C.Author
Chalker, Paul R.Author
Gaskell, Jeffrey M.Author
Murray, Robert T.Author
Joyce, Tim B.Author
Rushworth, Simon A.Author
Year2008 (March)Volume310
Issue5
PublisherElsevier BV
DOIdoi:10.1016/j.jcrysgro.2007.11.131Search in ResearchGate
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Mindat Ref. ID2893191Long-form Identifiermindat:1:5:2893191:1
GUID0
Full ReferenceBlack, Kate, Jones, Anthony C., Chalker, Paul R., Gaskell, Jeffrey M., Murray, Robert T., Joyce, Tim B., Rushworth, Simon A. (2008) MOCVD of ZnO thin films for potential use as compliant layers for GaN on Si. Journal of Crystal Growth, 310 (5). 1010-1014 doi:10.1016/j.jcrysgro.2007.11.131
Plain TextBlack, Kate, Jones, Anthony C., Chalker, Paul R., Gaskell, Jeffrey M., Murray, Robert T., Joyce, Tim B., Rushworth, Simon A. (2008) MOCVD of ZnO thin films for potential use as compliant layers for GaN on Si. Journal of Crystal Growth, 310 (5). 1010-1014 doi:10.1016/j.jcrysgro.2007.11.131
In(2008, March) Journal of Crystal Growth Vol. 310 (5) Elsevier BV


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