Black, Kate, Jones, Anthony C., Chalker, Paul R., Gaskell, Jeffrey M., Murray, Robert T., Joyce, Tim B., Rushworth, Simon A. (2008) MOCVD of ZnO thin films for potential use as compliant layers for GaN on Si. Journal of Crystal Growth, 310 (5). 1010-1014 doi:10.1016/j.jcrysgro.2007.11.131
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | MOCVD of ZnO thin films for potential use as compliant layers for GaN on Si | ||
Journal | Journal of Crystal Growth | ||
Authors | Black, Kate | Author | |
Jones, Anthony C. | Author | ||
Chalker, Paul R. | Author | ||
Gaskell, Jeffrey M. | Author | ||
Murray, Robert T. | Author | ||
Joyce, Tim B. | Author | ||
Rushworth, Simon A. | Author | ||
Year | 2008 (March) | Volume | 310 |
Issue | 5 | ||
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.jcrysgro.2007.11.131Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 2893191 | Long-form Identifier | mindat:1:5:2893191:1 |
GUID | 0 | ||
Full Reference | Black, Kate, Jones, Anthony C., Chalker, Paul R., Gaskell, Jeffrey M., Murray, Robert T., Joyce, Tim B., Rushworth, Simon A. (2008) MOCVD of ZnO thin films for potential use as compliant layers for GaN on Si. Journal of Crystal Growth, 310 (5). 1010-1014 doi:10.1016/j.jcrysgro.2007.11.131 | ||
Plain Text | Black, Kate, Jones, Anthony C., Chalker, Paul R., Gaskell, Jeffrey M., Murray, Robert T., Joyce, Tim B., Rushworth, Simon A. (2008) MOCVD of ZnO thin films for potential use as compliant layers for GaN on Si. Journal of Crystal Growth, 310 (5). 1010-1014 doi:10.1016/j.jcrysgro.2007.11.131 | ||
In | (2008, March) Journal of Crystal Growth Vol. 310 (5) Elsevier BV |
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