Reference Type | Journal (article/letter/editorial) |
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Title | Influence of grown-in defects on final oxygen precipitates during heat treatment of Cz-Si wafer analyzed by a coupled model with the interaction of point defects, oxygen precipitates, and dislocation loops |
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Journal | Journal of Crystal Growth |
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Authors | Gao, Bing | Author |
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Juel, Mari | Author |
Mhamdi, Mohammed | Author |
Year | 2016 (November) | Volume | 453 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/j.jcrysgro.2016.08.046Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 2912387 | Long-form Identifier | mindat:1:5:2912387:4 |
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GUID | 0 |
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Full Reference | Gao, Bing, Juel, Mari, Mhamdi, Mohammed (2016) Influence of grown-in defects on final oxygen precipitates during heat treatment of Cz-Si wafer analyzed by a coupled model with the interaction of point defects, oxygen precipitates, and dislocation loops. Journal of Crystal Growth, 453. 173-179 doi:10.1016/j.jcrysgro.2016.08.046 |
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Plain Text | Gao, Bing, Juel, Mari, Mhamdi, Mohammed (2016) Influence of grown-in defects on final oxygen precipitates during heat treatment of Cz-Si wafer analyzed by a coupled model with the interaction of point defects, oxygen precipitates, and dislocation loops. Journal of Crystal Growth, 453. 173-179 doi:10.1016/j.jcrysgro.2016.08.046 |
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In | (2016) Journal of Crystal Growth Vol. 453. Elsevier BV |
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