Reference Type | Journal (article/letter/editorial) |
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Title | Electron gas quality at various (110)-GaAs interfaces as benchmark for cleaved edge overgrowth |
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Journal | Journal of Crystal Growth |
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Authors | Riedi, S. | Author |
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Reichl, C. | Author |
Berl, M. | Author |
Alt, L. | Author |
Maier, A. | Author |
Wegscheider, W. | Author |
Year | 2016 (December) | Volume | 455 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/j.jcrysgro.2016.09.022Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 2912490 | Long-form Identifier | mindat:1:5:2912490:7 |
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GUID | 0 |
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Full Reference | Riedi, S., Reichl, C., Berl, M., Alt, L., Maier, A., Wegscheider, W. (2016) Electron gas quality at various (110)-GaAs interfaces as benchmark for cleaved edge overgrowth. Journal of Crystal Growth, 455. 37-42 doi:10.1016/j.jcrysgro.2016.09.022 |
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Plain Text | Riedi, S., Reichl, C., Berl, M., Alt, L., Maier, A., Wegscheider, W. (2016) Electron gas quality at various (110)-GaAs interfaces as benchmark for cleaved edge overgrowth. Journal of Crystal Growth, 455. 37-42 doi:10.1016/j.jcrysgro.2016.09.022 |
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In | (2016) Journal of Crystal Growth Vol. 455. Elsevier BV |
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