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Das, V.Damodara, Selvaraj, S. (2000) Structural and electrical properties of Bi2(Te0.4Se0.6)3 thin films. Materials Chemistry and Physics, 62. 68-74 doi:10.1016/s0254-0584(99)00165-0

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Reference TypeJournal (article/letter/editorial)
TitleStructural and electrical properties of Bi2(Te0.4Se0.6)3 thin films
JournalMaterials Chemistry and Physics
AuthorsDas, V.DamodaraAuthor
Selvaraj, S.Author
Year2000 (January)Volume62
PublisherElsevier BV
DOIdoi:10.1016/s0254-0584(99)00165-0Search in ResearchGate
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Mindat Ref. ID3051772Long-form Identifiermindat:1:5:3051772:3
GUID0
Full ReferenceDas, V.Damodara, Selvaraj, S. (2000) Structural and electrical properties of Bi2(Te0.4Se0.6)3 thin films. Materials Chemistry and Physics, 62. 68-74 doi:10.1016/s0254-0584(99)00165-0
Plain TextDas, V.Damodara, Selvaraj, S. (2000) Structural and electrical properties of Bi2(Te0.4Se0.6)3 thin films. Materials Chemistry and Physics, 62. 68-74 doi:10.1016/s0254-0584(99)00165-0
In(2000, January) Materials Chemistry and Physics Vol. 62 (1) Elsevier BV

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(2000) Index. Materials Chemistry and Physics, 62. 281pp. doi:10.1016/s0254-0584(99)00246-1
 
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