Reference Type | Journal (article/letter/editorial) |
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Title | Effect of ZnO Film Thicknesses on the Adhesive Strength of Electroless Cu Deposits |
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Journal | Chemistry Letters |
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Authors | Sun, Ren-De | Author |
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Tryk, Donald A. | Author |
Hashimoto, Kazuhito | Author |
Fujishima, Akira | Author |
Year | 1999 (January) | Volume | 28 |
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Issue | 1 |
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Publisher | The Chemical Society of Japan |
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DOI | doi:10.1246/cl.1999.11Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 3081738 | Long-form Identifier | mindat:1:5:3081738:6 |
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GUID | 0 |
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Full Reference | Sun, Ren-De, Tryk, Donald A., Hashimoto, Kazuhito, Fujishima, Akira (1999) Effect of ZnO Film Thicknesses on the Adhesive Strength of Electroless Cu Deposits. Chemistry Letters, 28 (1). 11-12 doi:10.1246/cl.1999.11 |
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Plain Text | Sun, Ren-De, Tryk, Donald A., Hashimoto, Kazuhito, Fujishima, Akira (1999) Effect of ZnO Film Thicknesses on the Adhesive Strength of Electroless Cu Deposits. Chemistry Letters, 28 (1). 11-12 doi:10.1246/cl.1999.11 |
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In | (1999, January) Chemistry Letters Vol. 28 (1) The Chemical Society of Japan |
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