Wang, Shoushan, Zhao, Peiwen, Zhang, Changzhe, Bu, Yuxiang (2016) Mechanisms Responsible for High Energy Radiation Induced Damage to Single-Stranded DNA Modified by Radiosensitizing 5-Halogenated Deoxyuridines. The Journal of Physical Chemistry B, 120 (10). 2649-2657 doi:10.1021/acs.jpcb.5b11432
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Mechanisms Responsible for High Energy Radiation Induced Damage to Single-Stranded DNA Modified by Radiosensitizing 5-Halogenated Deoxyuridines | ||
Journal | The Journal of Physical Chemistry B | ||
Authors | Wang, Shoushan | Author | |
Zhao, Peiwen | Author | ||
Zhang, Changzhe | Author | ||
Bu, Yuxiang | Author | ||
Year | 2016 (March 17) | Volume | 120 |
Issue | 10 | ||
Publisher | American Chemical Society (ACS) | ||
DOI | doi:10.1021/acs.jpcb.5b11432Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 3886231 | Long-form Identifier | mindat:1:5:3886231:9 |
GUID | 0 | ||
Full Reference | Wang, Shoushan, Zhao, Peiwen, Zhang, Changzhe, Bu, Yuxiang (2016) Mechanisms Responsible for High Energy Radiation Induced Damage to Single-Stranded DNA Modified by Radiosensitizing 5-Halogenated Deoxyuridines. The Journal of Physical Chemistry B, 120 (10). 2649-2657 doi:10.1021/acs.jpcb.5b11432 | ||
Plain Text | Wang, Shoushan, Zhao, Peiwen, Zhang, Changzhe, Bu, Yuxiang (2016) Mechanisms Responsible for High Energy Radiation Induced Damage to Single-Stranded DNA Modified by Radiosensitizing 5-Halogenated Deoxyuridines. The Journal of Physical Chemistry B, 120 (10). 2649-2657 doi:10.1021/acs.jpcb.5b11432 | ||
In | (2016, March) The Journal of Physical Chemistry B Vol. 120 (10) American Chemical Society (ACS) |
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