Reference Type | Journal (article/letter/editorial) |
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Title | Stress-Driven Oxidation Chemistry of Wet Silicon Surfaces |
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Journal | The Journal of Physical Chemistry C |
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Authors | Colombi Ciacchi, Lucio | Author |
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Cole, Daniel J. | Author |
Payne, Mike C. | Author |
Gumbsch, Peter | Author |
Year | 2008 (August) | Volume | 112 |
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Issue | 32 |
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Publisher | American Chemical Society (ACS) |
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DOI | doi:10.1021/jp804078nSearch in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 3896159 | Long-form Identifier | mindat:1:5:3896159:5 |
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GUID | 0 |
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Full Reference | Colombi Ciacchi, Lucio, Cole, Daniel J., Payne, Mike C., Gumbsch, Peter (2008) Stress-Driven Oxidation Chemistry of Wet Silicon Surfaces. The Journal of Physical Chemistry C, 112 (32). 12077-12080 doi:10.1021/jp804078n |
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Plain Text | Colombi Ciacchi, Lucio, Cole, Daniel J., Payne, Mike C., Gumbsch, Peter (2008) Stress-Driven Oxidation Chemistry of Wet Silicon Surfaces. The Journal of Physical Chemistry C, 112 (32). 12077-12080 doi:10.1021/jp804078n |
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In | (2008, August) The Journal of Physical Chemistry C Vol. 112 (32) American Chemical Society (ACS) |
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