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Bak, T., Nowotny, M. K., Sheppard, L. R., Nowotny, J. (2008) Effect of Prolonged Oxidation on Semiconducting Properties of Titanium Dioxide. The Journal of Physical Chemistry C, 112 (34). 13248-13257 doi:10.1021/jp803020d

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Reference TypeJournal (article/letter/editorial)
TitleEffect of Prolonged Oxidation on Semiconducting Properties of Titanium Dioxide
JournalThe Journal of Physical Chemistry C
AuthorsBak, T.Author
Nowotny, M. K.Author
Sheppard, L. R.Author
Nowotny, J.Author
Year2008 (August)Volume112
Issue34
PublisherAmerican Chemical Society (ACS)
DOIdoi:10.1021/jp803020dSearch in ResearchGate
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Mindat Ref. ID3896248Long-form Identifiermindat:1:5:3896248:8
GUID0
Full ReferenceBak, T., Nowotny, M. K., Sheppard, L. R., Nowotny, J. (2008) Effect of Prolonged Oxidation on Semiconducting Properties of Titanium Dioxide. The Journal of Physical Chemistry C, 112 (34). 13248-13257 doi:10.1021/jp803020d
Plain TextBak, T., Nowotny, M. K., Sheppard, L. R., Nowotny, J. (2008) Effect of Prolonged Oxidation on Semiconducting Properties of Titanium Dioxide. The Journal of Physical Chemistry C, 112 (34). 13248-13257 doi:10.1021/jp803020d
In(2008, August) The Journal of Physical Chemistry C Vol. 112 (34) American Chemical Society (ACS)

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Nowotny, J., Bak, T., Nowotny, M. K., Sheppard, L. R. (2008) Defect Chemistry and Electrical Properties of Titanium Dioxide. 2. Effect of Aliovalent Ions. The Journal of Physical Chemistry C, 112 (2). 602-610 doi:10.1021/jp0745642
Nowotny, J., Bak, T., Nowotny, M. K., Sheppard, L. R. (2008) Defect Chemistry and Electrical Properties of Titanium Dioxide. 1. Defect Diagrams. The Journal of Physical Chemistry C, 112 (2). 590-601 doi:10.1021/jp074565u
Bak, T., Nowotny, M. K., Sheppard, L. R., Nowotny, J. (2008) Charge Transport in Cr-Doped Titanium Dioxide. The Journal of Physical Chemistry C, 112 (18). 7255-7262 doi:10.1021/jp075652p
Bak, T., Nowotny, M. K., Sheppard, L. R., Nowotny, J. (2008) Mobility of Electronic Charge Carriers in Titanium Dioxide. The Journal of Physical Chemistry C, 112 (33). 12981-12987 doi:10.1021/jp801028j
Nowotny, M. K., Sheppard, L. R., Bak, T., Nowotny, J. (2008) Defect Chemistry of Titanium Dioxide. Application of Defect Engineering in Processing of TiO2-Based Photocatalysts. The Journal of Physical Chemistry C, 112 (14). 5275-5300 doi:10.1021/jp077275m
Sheppard, L. R., Bak, T., Nowotny, J. (2008) Electrical Properties of Niobium-Doped Titanium Dioxide. 3. Thermoelectric Power. The Journal of Physical Chemistry C, 112 (2). 611-617 doi:10.1021/jp0730491
Nowotny, J., Bak, T., Burg, T., Nowotny, M. K., Sheppard, L. R. (2007) Effect of Grain Boundaries on Semiconducting Properties of TiO2at Elevated Temperatures†. The Journal of Physical Chemistry C, 111 (27). 9769-9778 doi:10.1021/jp067869+
Nowotny, J., Bak, T., Sheppard, L. R., Nowotny, M. K. (2008) Reactivity of Titanium Dioxide with Oxygen at Room Temperature and the Related Charge Transfer. Journal Of The American Chemical Society, 130 (30) 9984-9993 doi:10.1021/ja7108695
Sheppard, L. R., Bak, T., Nowotny, J. (2006) Electrical Properties of Niobium-Doped Titanium Dioxide. 1. Defect Disorder†. The Journal of Physical Chemistry B, 110 (45). 22447-22454 doi:10.1021/jp0637025
Sheppard, L. R., Bak, T., Nowotny, J. (2006) Electrical Properties of Niobium-Doped Titanium Dioxide. 2. Equilibration Kinetics†. The Journal of Physical Chemistry B, 110 (45). 22455-22461 doi:10.1021/jp063703x
Bak, T., Nowotny, J., Nowotny, M. K. (2006) Defect Disorder of Titanium Dioxide. The Journal of Physical Chemistry B, 110 (43). 21560-21567 doi:10.1021/jp063700k
 
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