Scott, Adina, Hacker, Christina A., Janes, David B. (2008) In situ Structural Characterization of Metal−Molecule−Silicon Junctions Using Backside Infrared Spectroscopy. The Journal of Physical Chemistry C, 112 (36). 14021-14026 doi:10.1021/jp801715s
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | In situ Structural Characterization of Metal−Molecule−Silicon Junctions Using Backside Infrared Spectroscopy | ||
Journal | The Journal of Physical Chemistry C | ||
Authors | Scott, Adina | Author | |
Hacker, Christina A. | Author | ||
Janes, David B. | Author | ||
Year | 2008 (September 11) | Volume | 112 |
Issue | 36 | ||
Publisher | American Chemical Society (ACS) | ||
DOI | doi:10.1021/jp801715sSearch in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 3896358 | Long-form Identifier | mindat:1:5:3896358:4 |
GUID | 0 | ||
Full Reference | Scott, Adina, Hacker, Christina A., Janes, David B. (2008) In situ Structural Characterization of Metal−Molecule−Silicon Junctions Using Backside Infrared Spectroscopy. The Journal of Physical Chemistry C, 112 (36). 14021-14026 doi:10.1021/jp801715s | ||
Plain Text | Scott, Adina, Hacker, Christina A., Janes, David B. (2008) In situ Structural Characterization of Metal−Molecule−Silicon Junctions Using Backside Infrared Spectroscopy. The Journal of Physical Chemistry C, 112 (36). 14021-14026 doi:10.1021/jp801715s | ||
In | (2008, September) The Journal of Physical Chemistry C Vol. 112 (36) American Chemical Society (ACS) |
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