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Michałowski, Paweł Piotr, Knyps, Piotr, Ciepielewski, Paweł, Caban, Piotr A., Dumiszewska, Ewa, Kowalski, Grzegorz, Tokarczyk, Mateusz, Baranowski, Jacek M. (2019) Growth of highly oriented MoS2via an intercalation process in the graphene/SiC(0001) system. Physical Chemistry Chemical Physics, 21 (37). 20641-20646 doi:10.1039/c9cp03846a

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Reference TypeJournal (article/letter/editorial)
TitleGrowth of highly oriented MoS2via an intercalation process in the graphene/SiC(0001) system
JournalPhysical Chemistry Chemical Physics
AuthorsMichałowski, Paweł PiotrAuthor
Knyps, PiotrAuthor
Ciepielewski, PawełAuthor
Caban, Piotr A.Author
Dumiszewska, EwaAuthor
Kowalski, GrzegorzAuthor
Tokarczyk, MateuszAuthor
Baranowski, Jacek M.Author
Year2019Volume21
Issue37
PublisherRoyal Society of Chemistry (RSC)
DOIdoi:10.1039/c9cp03846aSearch in ResearchGate
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Mindat Ref. ID4037802Long-form Identifiermindat:1:5:4037802:6
GUID0
Full ReferenceMichałowski, Paweł Piotr, Knyps, Piotr, Ciepielewski, Paweł, Caban, Piotr A., Dumiszewska, Ewa, Kowalski, Grzegorz, Tokarczyk, Mateusz, Baranowski, Jacek M. (2019) Growth of highly oriented MoS2via an intercalation process in the graphene/SiC(0001) system. Physical Chemistry Chemical Physics, 21 (37). 20641-20646 doi:10.1039/c9cp03846a
Plain TextMichałowski, Paweł Piotr, Knyps, Piotr, Ciepielewski, Paweł, Caban, Piotr A., Dumiszewska, Ewa, Kowalski, Grzegorz, Tokarczyk, Mateusz, Baranowski, Jacek M. (2019) Growth of highly oriented MoS2via an intercalation process in the graphene/SiC(0001) system. Physical Chemistry Chemical Physics, 21 (37). 20641-20646 doi:10.1039/c9cp03846a
In(2019) Physical Chemistry Chemical Physics Vol. 21 (37) Royal Society of Chemistry (RSC)

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Michałowski, Paweł Piotr, Caban, Piotr, Baranowski, Jacek (2019) Secondary ion mass spectrometry investigation of carbon grain formation in boron nitride epitaxial layers with atomic depth resolution. Journal of Analytical Atomic Spectrometry, 34 (5). 848-853 doi:10.1039/c9ja00004f
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