She, Jihong, Yang, Jian-Feng, Jayaseelan, Daniel Doni, Ueno, Shunkichi, Kondo, Naoki, Ohji, Tatsuki, Kanzaki, Shuzo (2003) Strength of Silicon Nitride after Thermal Shock. Journal of the American Ceramic Society, 86 (9). 1619-1621 doi:10.1111/j.1151-2916.2003.tb03527.x
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Strength of Silicon Nitride after Thermal Shock | ||
Journal | Journal of the American Ceramic Society | ||
Authors | She, Jihong | Author | |
Yang, Jian-Feng | Author | ||
Jayaseelan, Daniel Doni | Author | ||
Ueno, Shunkichi | Author | ||
Kondo, Naoki | Author | ||
Ohji, Tatsuki | Author | ||
Kanzaki, Shuzo | Author | ||
Year | 2003 (September) | Volume | 86 |
Issue | 9 | ||
Publisher | Wiley | ||
DOI | doi:10.1111/j.1151-2916.2003.tb03527.xSearch in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 4097013 | Long-form Identifier | mindat:1:5:4097013:4 |
GUID | 0 | ||
Full Reference | She, Jihong, Yang, Jian-Feng, Jayaseelan, Daniel Doni, Ueno, Shunkichi, Kondo, Naoki, Ohji, Tatsuki, Kanzaki, Shuzo (2003) Strength of Silicon Nitride after Thermal Shock. Journal of the American Ceramic Society, 86 (9). 1619-1621 doi:10.1111/j.1151-2916.2003.tb03527.x | ||
Plain Text | She, Jihong, Yang, Jian-Feng, Jayaseelan, Daniel Doni, Ueno, Shunkichi, Kondo, Naoki, Ohji, Tatsuki, Kanzaki, Shuzo (2003) Strength of Silicon Nitride after Thermal Shock. Journal of the American Ceramic Society, 86 (9). 1619-1621 doi:10.1111/j.1151-2916.2003.tb03527.x | ||
In | (2003, September) Journal of the American Ceramic Society Vol. 86 (9) Wiley |
See Also
These are possibly similar items as determined by title/reference text matching only.