Reference Type | Journal (article/letter/editorial) |
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Title | Effect of Oxygen Partial Pressure on the Dielectric Properties and Microstructures of Cofired Base-Metal-Electrode Multilayer Ceramic Capacitors |
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Journal | Journal of the American Ceramic Society |
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Authors | Feng, Qiquan | Author |
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McConville, Caspar J. | Author |
Edwards, Doreen D. | Author |
McCauley, Daniel E. | Author |
Chu, Mike | Author |
Year | 2006 (March) | Volume | 89 |
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Issue | 3 |
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Publisher | Wiley |
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DOI | doi:10.1111/j.1551-2916.2005.00787.xSearch in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 4098438 | Long-form Identifier | mindat:1:5:4098438:6 |
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GUID | 0 |
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Full Reference | Feng, Qiquan, McConville, Caspar J., Edwards, Doreen D., McCauley, Daniel E., Chu, Mike (2006) Effect of Oxygen Partial Pressure on the Dielectric Properties and Microstructures of Cofired Base-Metal-Electrode Multilayer Ceramic Capacitors. Journal of the American Ceramic Society, 89 (3). 894-901 doi:10.1111/j.1551-2916.2005.00787.x |
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Plain Text | Feng, Qiquan, McConville, Caspar J., Edwards, Doreen D., McCauley, Daniel E., Chu, Mike (2006) Effect of Oxygen Partial Pressure on the Dielectric Properties and Microstructures of Cofired Base-Metal-Electrode Multilayer Ceramic Capacitors. Journal of the American Ceramic Society, 89 (3). 894-901 doi:10.1111/j.1551-2916.2005.00787.x |
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In | (2006, March) Journal of the American Ceramic Society Vol. 89 (3) Wiley |
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