Reference Type | Journal (article/letter/editorial) |
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Title | Effect of undersized solute atoms on point defect behavior in V–A (A=Fe, Cr and Si) binary alloys studied by using HVEM |
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Journal | Journal of Nuclear Materials |
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Authors | Hayashi, T. | Author |
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Fukumoto, K. | Author |
Matsui, H. | Author |
Year | 2002 (December) | Volume | 307 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/s0022-3115(02)01162-5Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 4156144 | Long-form Identifier | mindat:1:5:4156144:7 |
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GUID | 0 |
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Full Reference | Hayashi, T., Fukumoto, K., Matsui, H. (2002) Effect of undersized solute atoms on point defect behavior in V–A (A=Fe, Cr and Si) binary alloys studied by using HVEM. Journal of Nuclear Materials, 307. 930-934 doi:10.1016/s0022-3115(02)01162-5 |
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Plain Text | Hayashi, T., Fukumoto, K., Matsui, H. (2002) Effect of undersized solute atoms on point defect behavior in V–A (A=Fe, Cr and Si) binary alloys studied by using HVEM. Journal of Nuclear Materials, 307. 930-934 doi:10.1016/s0022-3115(02)01162-5 |
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In | (2002) Journal of Nuclear Materials Vol. 307. Elsevier BV |
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