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Lin, Peng, Ren, Wei, Wu, Xiaoqing, Shi, Peng, Chen, Xiaofeng, Yao, Xi (2008) Thickness effects on structures and electrical properties of lead zirconate titanate thick films. Ceramics International, 34. 991-995 doi:10.1016/j.ceramint.2007.09.052

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Reference TypeJournal (article/letter/editorial)
TitleThickness effects on structures and electrical properties of lead zirconate titanate thick films
JournalCeramics International
AuthorsLin, PengAuthor
Ren, WeiAuthor
Wu, XiaoqingAuthor
Shi, PengAuthor
Chen, XiaofengAuthor
Yao, XiAuthor
Year2008 (May)Volume34
PublisherElsevier BV
DOIdoi:10.1016/j.ceramint.2007.09.052Search in ResearchGate
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Mindat Ref. ID4200520Long-form Identifiermindat:1:5:4200520:3
GUID0
Full ReferenceLin, Peng, Ren, Wei, Wu, Xiaoqing, Shi, Peng, Chen, Xiaofeng, Yao, Xi (2008) Thickness effects on structures and electrical properties of lead zirconate titanate thick films. Ceramics International, 34. 991-995 doi:10.1016/j.ceramint.2007.09.052
Plain TextLin, Peng, Ren, Wei, Wu, Xiaoqing, Shi, Peng, Chen, Xiaofeng, Yao, Xi (2008) Thickness effects on structures and electrical properties of lead zirconate titanate thick films. Ceramics International, 34. 991-995 doi:10.1016/j.ceramint.2007.09.052
In(2008) Ceramics International Vol. 34. Elsevier BV

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