Eroglu, S., Gallois, B. (2011) Chemical vapor deposition and composition–depth profiling of a graded coating by Auger electron spectroscopy used in conjunction with taper polishing. Ceramics International, 37. 1301-1306 doi:10.1016/j.ceramint.2010.12.001
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Chemical vapor deposition and composition–depth profiling of a graded coating by Auger electron spectroscopy used in conjunction with taper polishing | ||
Journal | Ceramics International | ||
Authors | Eroglu, S. | Author | |
Gallois, B. | Author | ||
Year | 2011 (May) | Volume | 37 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.ceramint.2010.12.001Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 4201812 | Long-form Identifier | mindat:1:5:4201812:8 |
GUID | 0 | ||
Full Reference | Eroglu, S., Gallois, B. (2011) Chemical vapor deposition and composition–depth profiling of a graded coating by Auger electron spectroscopy used in conjunction with taper polishing. Ceramics International, 37. 1301-1306 doi:10.1016/j.ceramint.2010.12.001 | ||
Plain Text | Eroglu, S., Gallois, B. (2011) Chemical vapor deposition and composition–depth profiling of a graded coating by Auger electron spectroscopy used in conjunction with taper polishing. Ceramics International, 37. 1301-1306 doi:10.1016/j.ceramint.2010.12.001 | ||
In | (2011) Ceramics International Vol. 37. Elsevier BV |
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