Robertson, B. F., Reid, J. S. (1979) X-ray scattering intensities from a shell model for silicon. Acta Crystallographica Section A: Crystal Physics, Diffraction, Theoretical and General Crystallography, 35 (5). 785-788 doi:10.1107/s0567739479001790
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | X-ray scattering intensities from a shell model for silicon | ||
Journal | Acta Crystallographica Section A: Crystal Physics, Diffraction, Theoretical and General Crystallography | ||
Authors | Robertson, B. F. | Author | |
Reid, J. S. | Author | ||
Year | 1979 (September 1) | Volume | 35 |
Issue | 5 | ||
Publisher | International Union of Crystallography (IUCr) | ||
DOI | doi:10.1107/s0567739479001790Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 4570711 | Long-form Identifier | mindat:1:5:4570711:7 |
GUID | 0 | ||
Full Reference | Robertson, B. F., Reid, J. S. (1979) X-ray scattering intensities from a shell model for silicon. Acta Crystallographica Section A: Crystal Physics, Diffraction, Theoretical and General Crystallography, 35 (5). 785-788 doi:10.1107/s0567739479001790 | ||
Plain Text | Robertson, B. F., Reid, J. S. (1979) X-ray scattering intensities from a shell model for silicon. Acta Crystallographica Section A: Crystal Physics, Diffraction, Theoretical and General Crystallography, 35 (5). 785-788 doi:10.1107/s0567739479001790 | ||
In | (1979, September) Acta Crystallographica Section A: Crystal Physics, Diffraction, Theoretical and General Crystallography Vol. 35 (5) International Union of Crystallography (IUCr) |
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