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Harris, N., Kirkham, A. J. (1971) A single-exposure method for the determination of lattice spacings and crystal orientation from Kossel diffraction patterns. Journal of Applied Crystallography, 4 (3) 232-240 doi:10.1107/s0021889871006757

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Reference TypeJournal (article/letter/editorial)
TitleA single-exposure method for the determination of lattice spacings and crystal orientation from Kossel diffraction patterns
JournalJournal of Applied Crystallography
AuthorsHarris, N.Author
Kirkham, A. J.Author
Year1971 (June 1)Volume4
Issue3
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0021889871006757Search in ResearchGate
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Mindat Ref. ID462912Long-form Identifiermindat:1:5:462912:6
GUID0
Full ReferenceHarris, N., Kirkham, A. J. (1971) A single-exposure method for the determination of lattice spacings and crystal orientation from Kossel diffraction patterns. Journal of Applied Crystallography, 4 (3) 232-240 doi:10.1107/s0021889871006757
Plain TextHarris, N., Kirkham, A. J. (1971) A single-exposure method for the determination of lattice spacings and crystal orientation from Kossel diffraction patterns. Journal of Applied Crystallography, 4 (3) 232-240 doi:10.1107/s0021889871006757
In(1971, June) Journal of Applied Crystallography Vol. 4 (3) International Union of Crystallography (IUCr)

See Also

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Fisher, D. G., Harris, N. (1970) A computer program for the calculation of lattice spacings from Kossel diffraction patterns. Journal of Applied Crystallography, 3 (5) 305-313 doi:10.1107/s0021889870006349
Morawiec, A. (2016) A program for refinement of lattice parameters and strain determination using Kossel diffraction patterns. Journal of Applied Crystallography, 49 (1). 322-329 doi:10.1107/s1600576715024656
Popović, S. (1971) An X-ray diffraction method for lattice parameter measurements from correspondingKα andKβ reflexions. Journal of Applied Crystallography, 4 (3) 240-241 doi:10.1107/s0021889871006769
Clarke, P. T. (1971) The direct determination of interplanar spacings and crystal orientations from kossel patterns. physica status solidi (a), 6 (2). 575-580 doi:10.1002/pssa.2210060226
Tajiri, H., Toyokawa, H., Sakata, O. (2008) Precise determination of crystal orientation for surface X-ray diffraction using Kossel line. Acta Crystallographica Section A Foundations of Crystallography, 64. doi:10.1107/s0108767308082366
Ferran, G., Wood, R. A. (1970) Computerized gnomonic projection chart for determining orientations of single crystals from Kossel patterns. Journal of Applied Crystallography, 3 (5) 419-421 doi:10.1107/s0021889870006611
Morawiec, A. (1999) Automatic orientation determination from Kikuchi patterns. Journal of Applied Crystallography, 32 (4). 788-798 doi:10.1107/s002188989900549x
Morawiec, A. (2017) Ind_X: program for indexing single-crystal diffraction patterns. Journal of Applied Crystallography, 50 (2). 647-650 doi:10.1107/s1600576717000516
Ebdon, F. R., Wheeler, D. A. (1971) A self-regulating mini-cooler for three-dimensional single-crystal neutron-diffraction measurements. Journal of Applied Crystallography, 4 (3) 254-255 doi:10.1107/s0021889871006800
Biggin, S., Dingley, D. J. (1977) A general method for locating the X-ray source point in Kossel diffraction. Journal of Applied Crystallography, 10 (5) 376-385 doi:10.1107/s0021889877013806
Denne, W. A. (1971) Simplification of automatic crystal orientation and unit-cell determination by the use of white-radiation streaks. Journal of Applied Crystallography, 4 (2) 172 doi:10.1107/s0021889871006563
 
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