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Jung, Sungchul, Jeon, Youngeun, Jin, Hanbyul, Lee, Jung-Yong, Ko, Jae-Hyeon, Kim, Nam, Eom, Daejin, Park, Kibog (2016) Giant Electroresistance in Edge Metal-Insulator-Metal Tunnel Junctions Induced by Ferroelectric Fringe Fields. Scientific Reports, 6. doi:10.1038/srep30646

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Reference TypeJournal (article/letter/editorial)
TitleGiant Electroresistance in Edge Metal-Insulator-Metal Tunnel Junctions Induced by Ferroelectric Fringe Fields
JournalScientific Reports
AuthorsJung, SungchulAuthor
Jeon, YoungeunAuthor
Jin, HanbyulAuthor
Lee, Jung-YongAuthor
Ko, Jae-HyeonAuthor
Kim, NamAuthor
Eom, DaejinAuthor
Park, KibogAuthor
Year2016 (August)Volume6
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1038/srep30646Search in ResearchGate
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Mindat Ref. ID4652502Long-form Identifiermindat:1:5:4652502:4
GUID0
Full ReferenceJung, Sungchul, Jeon, Youngeun, Jin, Hanbyul, Lee, Jung-Yong, Ko, Jae-Hyeon, Kim, Nam, Eom, Daejin, Park, Kibog (2016) Giant Electroresistance in Edge Metal-Insulator-Metal Tunnel Junctions Induced by Ferroelectric Fringe Fields. Scientific Reports, 6. doi:10.1038/srep30646
Plain TextJung, Sungchul, Jeon, Youngeun, Jin, Hanbyul, Lee, Jung-Yong, Ko, Jae-Hyeon, Kim, Nam, Eom, Daejin, Park, Kibog (2016) Giant Electroresistance in Edge Metal-Insulator-Metal Tunnel Junctions Induced by Ferroelectric Fringe Fields. Scientific Reports, 6. doi:10.1038/srep30646
In(2016) Scientific Reports Vol. 6. Springer Science and Business Media LLC

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