Reference Type | Journal (article/letter/editorial) |
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Title | On the reliability of fully automatic indexing of electron diffraction patterns obtained in a transmission electron microscope |
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Journal | Journal of Applied Crystallography |
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Authors | Morawiec, A. | Author |
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Bouzy, E. | Author |
Year | 2006 (February 1) | Volume | 39 |
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Issue | 1 |
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Publisher | International Union of Crystallography (IUCr) |
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DOI | doi:10.1107/s0021889805032966Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 4669229 | Long-form Identifier | mindat:1:5:4669229:2 |
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GUID | 0 |
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Full Reference | Morawiec, A., Bouzy, E. (2006) On the reliability of fully automatic indexing of electron diffraction patterns obtained in a transmission electron microscope. Journal of Applied Crystallography, 39 (1). 101-103 doi:10.1107/s0021889805032966 |
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Plain Text | Morawiec, A., Bouzy, E. (2006) On the reliability of fully automatic indexing of electron diffraction patterns obtained in a transmission electron microscope. Journal of Applied Crystallography, 39 (1). 101-103 doi:10.1107/s0021889805032966 |
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In | (2006, February) Journal of Applied Crystallography Vol. 39 (1) International Union of Crystallography (IUCr) |
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