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Boeuf, A., Lagomarsino, S., Mazkedian, S., Melone, S., Puliti, P., Rustichelli, F. (1978) X-ray diffraction characteristics of curved monochromators for synchrotron radiation. Journal of Applied Crystallography, 11 (5) 442-449 doi:10.1107/s0021889878013564

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Reference TypeJournal (article/letter/editorial)
TitleX-ray diffraction characteristics of curved monochromators for synchrotron radiation
JournalJournal of Applied Crystallography
AuthorsBoeuf, A.Author
Lagomarsino, S.Author
Mazkedian, S.Author
Melone, S.Author
Puliti, P.Author
Rustichelli, F.Author
Year1978 (October 1)Volume11
Issue5
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0021889878013564Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID466941Long-form Identifiermindat:1:5:466941:2
GUID0
Full ReferenceBoeuf, A., Lagomarsino, S., Mazkedian, S., Melone, S., Puliti, P., Rustichelli, F. (1978) X-ray diffraction characteristics of curved monochromators for synchrotron radiation. Journal of Applied Crystallography, 11 (5) 442-449 doi:10.1107/s0021889878013564
Plain TextBoeuf, A., Lagomarsino, S., Mazkedian, S., Melone, S., Puliti, P., Rustichelli, F. (1978) X-ray diffraction characteristics of curved monochromators for synchrotron radiation. Journal of Applied Crystallography, 11 (5) 442-449 doi:10.1107/s0021889878013564
In(1978, October) Journal of Applied Crystallography Vol. 11 (5) International Union of Crystallography (IUCr)


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