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Azanza Ricardo, Cristy L., D'Incau, Mirco, Scardi, Paolo (2007) Revision and extension of the standard laboratory technique for X-ray diffraction measurement of residual stress gradients. Journal of Applied Crystallography, 40 (4). 675-683 doi:10.1107/s0021889807022935

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Reference TypeJournal (article/letter/editorial)
TitleRevision and extension of the standard laboratory technique for X-ray diffraction measurement of residual stress gradients
JournalJournal of Applied Crystallography
AuthorsAzanza Ricardo, Cristy L.Author
D'Incau, MircoAuthor
Scardi, PaoloAuthor
Year2007 (August 1)Volume40
Issue4
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0021889807022935Search in ResearchGate
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Mindat Ref. ID4670063Long-form Identifiermindat:1:5:4670063:4
GUID0
Full ReferenceAzanza Ricardo, Cristy L., D'Incau, Mirco, Scardi, Paolo (2007) Revision and extension of the standard laboratory technique for X-ray diffraction measurement of residual stress gradients. Journal of Applied Crystallography, 40 (4). 675-683 doi:10.1107/s0021889807022935
Plain TextAzanza Ricardo, Cristy L., D'Incau, Mirco, Scardi, Paolo (2007) Revision and extension of the standard laboratory technique for X-ray diffraction measurement of residual stress gradients. Journal of Applied Crystallography, 40 (4). 675-683 doi:10.1107/s0021889807022935
In(2007, August) Journal of Applied Crystallography Vol. 40 (4) International Union of Crystallography (IUCr)

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Azanza Ricardo, Cristy Leonor, D'Incau, Mirco, Scardi, Paolo (2006) Sub-Surface Residual Stress Gradients: Advances in Laboratory XRD Methods. Materials Science Forum, 524. 25-30 doi:10.4028/www.scientific.net/msf.524-525.25
Ortolani, Matteo, Azanza Ricardo, Cristy Leonor, Scardi, Paolo (2009) Measurement of stress factors and residual stress of a film byin situX-ray diffraction during four-point bending. Journal of Applied Crystallography, 42 (6). 1102-1109 doi:10.1107/s0021889809035857
Cecchin, Diego, Azanza Ricardo, Cristy Leonor, D'Incau, Mirco, Bandini, Michele, Scardi, Paolo (2013) Influence of Shot-Peening Parameters on the Sub-Surface Residual Stress Profiles in Al-7075 Alloy Components. Materials Science Forum, 768. 66-71 doi:10.4028/www.scientific.net/msf.768-769.66
Cecchin, Diego, Kobza, Evgeny, Cazzolli, Marco, Azanza Ricardo, Cristy Leonor, D'Incau, Mirco, Bandini, Michele, Scardi, Paolo (2014) Influence of Tempering Conditions on Shot-Peened Tool Steel Components In-Depth Residual Stress Profiles. Advanced Materials Research, 996. 769-774 doi:10.4028/www.scientific.net/amr.996.769
Scardi, Paolo, Azanza Ricardo, Cristy L., Perez-Demydenko, Camilo, Coelho, Alan A. (2018) Whole powder pattern modelling macros for TOPAS. Journal of Applied Crystallography, 51 (6). 1752-1765 doi:10.1107/s160057671801289x
Gelisio, Luca, Azanza Ricardo, Cristy Leonor, Leoni, Matteo, Scardi, Paolo (2010) Real-space calculation of powder diffraction patterns on graphics processing units. Journal of Applied Crystallography, 43 (3). 647-653 doi:10.1107/s0021889810005133
Ortolani, Matteo, Azanza Ricardo, Cristy Leonor, Scardi, Paolo (2010) Analysis of Residual Stress-Texture Relationships in Thin Films. Advanced Materials Research, 89. 425-430 doi:10.4028/www.scientific.net/amr.89-91.425
Azanza Ricardo, Cristy Leonor, Degan, G., Bandini, M., Scardi, Paolo (2010) Residual Stress Depth-Profiling in Shot-Peened Al Alloy Components Subjected to Fatigue Testing. Materials Science Forum, 638. 2464-2469 doi:10.4028/www.scientific.net/msf.638-642.2464
Leoni, Matteo, Martinez-Garcia, Jorge, Scardi, Paolo (2007) Dislocation effects in powder diffraction. Journal of Applied Crystallography, 40 (4). 719-724 doi:10.1107/s002188980702078x
Ortolani, Matteo, Azanza Ricardo, Cristy Leonor, Lausi, Andrea, Scardi, Paolo (2011) Thin Film Stress and Texture Analysis at the MCX Synchrotron Radiation Beamline at ELETTRA. Materials Science Forum, 681. 115-120 doi:10.4028/www.scientific.net/msf.681.115
Scardi, Paolo, Leoni, Matteo (1999) Fourier modelling of the anisotropic line broadening of X-ray diffraction profiles due to line and plane lattice defects. Journal of Applied Crystallography, 32 (4). 671-682 doi:10.1107/s002188989900374x
 
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