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Shin, J., Cornelius, T. W., Labat, S., Lauraux, F., Richard, M.-I., Richter, G., Blanchard, N. P., Gianola, D. S., Thomas, O. (2018) In situ Bragg coherent X-ray diffraction during tensile testing of an individual Au nanowire. Journal of Applied Crystallography, 51 (3). 781-788 doi:10.1107/s1600576718004910

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Reference TypeJournal (article/letter/editorial)
TitleIn situ Bragg coherent X-ray diffraction during tensile testing of an individual Au nanowire
JournalJournal of Applied Crystallography
AuthorsShin, J.Author
Cornelius, T. W.Author
Labat, S.Author
Lauraux, F.Author
Richard, M.-I.Author
Richter, G.Author
Blanchard, N. P.Author
Gianola, D. S.Author
Thomas, O.Author
Year2018 (June 1)Volume51
Issue3
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s1600576718004910Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4674992Long-form Identifiermindat:1:5:4674992:5
GUID0
Full ReferenceShin, J., Cornelius, T. W., Labat, S., Lauraux, F., Richard, M.-I., Richter, G., Blanchard, N. P., Gianola, D. S., Thomas, O. (2018) In situ Bragg coherent X-ray diffraction during tensile testing of an individual Au nanowire. Journal of Applied Crystallography, 51 (3). 781-788 doi:10.1107/s1600576718004910
Plain TextShin, J., Cornelius, T. W., Labat, S., Lauraux, F., Richard, M.-I., Richter, G., Blanchard, N. P., Gianola, D. S., Thomas, O. (2018) In situ Bragg coherent X-ray diffraction during tensile testing of an individual Au nanowire. Journal of Applied Crystallography, 51 (3). 781-788 doi:10.1107/s1600576718004910
In(2018, June) Journal of Applied Crystallography Vol. 51 (3) International Union of Crystallography (IUCr)

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Beutier, G., Verdier, M., de Boissieu, M., Gilles, B., Parry, G., Livet, F., Richard, M. -I., Labat, S., Thomas, O., Cornelius, T. (2011) Coherent X-ray diffraction of copper islands underin situloading. Acta Crystallographica Section A Foundations of Crystallography, 67. doi:10.1107/s0108767311097947
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