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Thompson, P., Cox, D. E., Hastings, J. B. (1987) Rietveld refinement of Debye–Scherrer synchrotron X-ray data from Al2O3. Journal of Applied Crystallography, 20 (2) 79-83 doi:10.1107/s0021889887087090

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Reference TypeJournal (article/letter/editorial)
TitleRietveld refinement of Debye–Scherrer synchrotron X-ray data from Al2O3
JournalJournal of Applied Crystallography
AuthorsThompson, P.Author
Cox, D. E.Author
Hastings, J. B.Author
Year1987 (April 1)Volume20
Issue2
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0021889887087090Search in ResearchGate
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Mindat Ref. ID471034Long-form Identifiermindat:1:5:471034:3
GUID0
Full ReferenceThompson, P., Cox, D. E., Hastings, J. B. (1987) Rietveld refinement of Debye–Scherrer synchrotron X-ray data from Al2O3. Journal of Applied Crystallography, 20 (2) 79-83 doi:10.1107/s0021889887087090
Plain TextThompson, P., Cox, D. E., Hastings, J. B. (1987) Rietveld refinement of Debye–Scherrer synchrotron X-ray data from Al2O3. Journal of Applied Crystallography, 20 (2) 79-83 doi:10.1107/s0021889887087090
In(1987, April) Journal of Applied Crystallography Vol. 20 (2) International Union of Crystallography (IUCr)

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Thompson, P., Wood, I. G. (1983) X-ray Rietveld refinement using Debye–Scherrer geometry. Journal of Applied Crystallography, 16 (5) 458-472 doi:10.1107/s0021889883010845
Cox, D. E., Hastings, J. B., Thomlinson, W. (1984) Rietveld refinement of synchrotron X-ray powder data: the structure of Ba2SrWO6. Acta Crystallographica Section A Foundations of Crystallography, 40. doi:10.1107/s0108767384089212
Hastings, J. B., Thomlinson, W., Cox, D. E. (1984) Synchrotron X-ray powder diffraction. Journal of Applied Crystallography, 17 (2) 85-95 doi:10.1107/s0021889884011043
Baerlocher, Ch., Schicker, P., Cox, D. E. (1987) X-ray Rietveld structure refinement of monoclinic ZSM-5. Acta Crystallographica Section A Foundations of Crystallography, 43. doi:10.1107/s0108767387079248
McCusker, L. B., Von Dreele, R. B., Cox, D. E., Louër, D., Scardi, P. (1999) Rietveld refinement guidelines. Journal of Applied Crystallography, 32 (1). 36-50 doi:10.1107/s0021889898009856
Khattak, C. P., Cox, D. E. (1977) Profile analysis of X-ray powder diffractometer data: structural refinement of La0.75Sr0.25CrO3. Journal of Applied Crystallography, 10 (5) 405-411 doi:10.1107/s0021889877013855
Post, J. E., Bish, D. L. (1987) Rietveld refinement and difference Fourier analysis of the todorokite structure using powder X-ray data. Acta Crystallographica Section A Foundations of Crystallography, 43. doi:10.1107/s0108767387079236
Hohlwein, D., Siddons, D. P., Hastings, J. B. (1988) A graphite double-crystal monochromator for X-ray synchrotron radiation. Journal of Applied Crystallography, 21 (6). 911-915 doi:10.1107/s0021889888007484
Smrčok, Ľ. (1987) Rietveld refinement of 3CaO.Al2O3.6H2O. Journal of Applied Crystallography, 20 (4) 320-322 doi:10.1107/s002188988708659x
Gualtieri, A., Norby, P., Hanson, J., Hriljac, J. (1996) Rietveld Refinement using Synchrotron X-ray Powder Diffraction Data Collected in Transmission Geometry using an Imaging-Plate Detector: Application to Standardm-ZrO2. Journal of Applied Crystallography, 29 (6). 707-713 doi:10.1107/s0021889896008199
Cox, D. E. (1984) Peak shapes and halfwidths in Rietveld refinement of powder diffraction data. Acta Crystallographica Section A Foundations of Crystallography, 40. doi:10.1107/s0108767384089182
 
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