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Lang, A. R. (1954) A Proposed Method for Electronic Intensification of Single‐Crystal X‐Ray Diffraction Images. Review of Scientific Instruments, 25 (10). 1032-1033 doi:10.1063/1.1770914

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Reference TypeJournal (article/letter/editorial)
TitleA Proposed Method for Electronic Intensification of Single‐Crystal X‐Ray Diffraction Images
JournalReview of Scientific Instruments
AuthorsLang, A. R.Author
Year1954 (October)Volume25
Issue10
PublisherAIP Publishing
DOIdoi:10.1063/1.1770914
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Mindat Ref. ID4788478Long-form Identifiermindat:1:5:4788478:4
GUID0
Full ReferenceLang, A. R. (1954) A Proposed Method for Electronic Intensification of Single‐Crystal X‐Ray Diffraction Images. Review of Scientific Instruments, 25 (10). 1032-1033 doi:10.1063/1.1770914
Plain TextLang, A. R. (1954) A Proposed Method for Electronic Intensification of Single‐Crystal X‐Ray Diffraction Images. Review of Scientific Instruments, 25 (10). 1032-1033 doi:10.1063/1.1770914
In(1954, October) Review of Scientific Instruments Vol. 25 (10) AIP Publishing

See Also

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Hoekstra, John J., Ke, Bacon, Trivich, Dan (1954) A Device for Preparing Single Crystal Spheres. Review of Scientific Instruments, 25 (10). 1033-1034 doi:10.1063/1.1770915
Lang, A. R. (1954) Suggested Necessary Conditions for Successful Use of the Stationary Crystal Integrated Reflection Measuring Method with the Counter Spectrometer. Review of Scientific Instruments, 25 (10). 1039-1040 doi:10.1063/1.1770923
Knapp, G. S., Beno, M. A. (1992) A new method to do time‐resolved, x‐ray diffraction studies: The rotating crystal Laue method. Review of Scientific Instruments, 63 (1). 1032-1034 doi:10.1063/1.1143191
Quan, J. T. (1954) A Split‐Image Film Comparator for X‐Ray Diffraction Powder Patterns. Review of Scientific Instruments, 25 (4). 399-401 doi:10.1063/1.1771086
Pepinsky, R., Frazer, B. C., McKeown, M. L. (1954) New Goniometers for Single‐Crystal Neutron Diffraction Studies. Review of Scientific Instruments, 25 (7). 699-703 doi:10.1063/1.1771163
Kaufman, H. S., Fankuchen, I. (1949) A Low Temperature Single Crystal X‐Ray Diffraction Technique. Review of Scientific Instruments, 20 (10). 733-734 doi:10.1063/1.1741367
Birks, L. S. (1954) Apparatus for X‐Ray Diffraction Studies of Metals under Controlled Stress at Elevated Temperature. Review of Scientific Instruments, 25 (10). 963-966 doi:10.1063/1.1770929
Dernier, P. D. (1972) A Low Temperature Baffle for Single Crystal X‐Ray Diffraction. Review of Scientific Instruments, 43 (6). 931-933 doi:10.1063/1.1685810
Allan, D. R., Miletich, R., Angel, R. J. (1996) A diamond‐anvil cell for single‐crystal x‐ray diffraction studies to pressures in excess of 10 GPa. Review of Scientific Instruments, 67 (3). 840-842 doi:10.1063/1.1146820
Lang, A R (1971) A versatile electronic image intensification system for X-ray topography. Journal of Physics E: Scientific Instruments, 4 (11). 921-922 doi:10.1088/0022-3735/4/11/037
Emura, Shuichi, Maeda, Hironobu (1994) Simple removal method of diffraction peaks in x‐ray absorption fine structure spectra from a single crystal in the fluorescence mode. Review of Scientific Instruments, 65 (1). 25-27 doi:10.1063/1.1144793
 
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