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Furnas, Thomas C., Harker, David (1955) Apparatus for Measuring Complete Single‐Crystal X‐Ray Diffraction Data by Means of a Geiger Counter Diffractometer. Review of Scientific Instruments, 26 (5). 449-453 doi:10.1063/1.1771322

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Reference TypeJournal (article/letter/editorial)
TitleApparatus for Measuring Complete Single‐Crystal X‐Ray Diffraction Data by Means of a Geiger Counter Diffractometer
JournalReview of Scientific Instruments
AuthorsFurnas, Thomas C.Author
Harker, DavidAuthor
Year1955 (May)Volume26
Issue5
PublisherAIP Publishing
DOIdoi:10.1063/1.1771322
Generate Citation Formats
Mindat Ref. ID4789975Long-form Identifiermindat:1:5:4789975:9
GUID0
Full ReferenceFurnas, Thomas C., Harker, David (1955) Apparatus for Measuring Complete Single‐Crystal X‐Ray Diffraction Data by Means of a Geiger Counter Diffractometer. Review of Scientific Instruments, 26 (5). 449-453 doi:10.1063/1.1771322
Plain TextFurnas, Thomas C., Harker, David (1955) Apparatus for Measuring Complete Single‐Crystal X‐Ray Diffraction Data by Means of a Geiger Counter Diffractometer. Review of Scientific Instruments, 26 (5). 449-453 doi:10.1063/1.1771322
In(1955, May) Review of Scientific Instruments Vol. 26 (5) AIP Publishing

See Also

These are possibly similar items as determined by title/reference text matching only.

Furnas, Thomas C. (1957) Point‐Focusing Two‐Crystal X‐Ray Monochromator for X‐Ray Diffraction. Review of Scientific Instruments, 28 (12). 1042-1048 doi:10.1063/1.1715798
Banerjee, Bani R. (1955) Reflected Beam X‐Ray Monochromator for Geiger Counter Diffractometry. Review of Scientific Instruments, 26 (6). 564-565 doi:10.1063/1.1715245
Chiotti, P. (1954) Adaptation of a Geiger‐Counter X‐Ray Diffractometer for High‐Temperature Investigations. Review of Scientific Instruments, 25 (7). 683-688 doi:10.1063/1.1771159
Rodriguez, S. E., Caputi, R. W., Pings, C. J. (1965) Apparatus for X‐Ray Diffraction Studies of Liquids. Review of Scientific Instruments, 36 (4). 449-453 doi:10.1063/1.1719596
Lang, A. R. (1955) Focusing Transmission Specimen Technique for the X‐Ray Diffractometer. Review of Scientific Instruments, 26 (7). 680-689 doi:10.1063/1.1715286
Pease, R. S. (1955) X‐Ray Diffraction Data from Radioactive Materials. Review of Scientific Instruments, 26 (12). 1204 doi:10.1063/1.1715227
Beu, Karl E. (1947) A Means for Eliminating ``Paper Grain'' from X‐Ray Diffraction Films. Review of Scientific Instruments, 18 (6). 453 doi:10.1063/1.1740976
Schiferl, David (1977) 50‐kilobar gasketed diamond anvil cell for single‐crystal x‐ray diffractometer use with the crystal structure of Sb up to 26 kilobars as a test problem. Review of Scientific Instruments, 48 (1). 24-30 doi:10.1063/1.1134861
Bredig, M. A., Klein, G. E., Borie, B. S. (1955) X‐Ray Diffractometer for Highly Radioactive Materials. Review of Scientific Instruments, 26 (6). 610 doi:10.1063/1.1715258
Friedman, H., Birks, L. S. (1948) A Geiger Counter Spectrometer for X‐Ray Fluorescence Analysis. Review of Scientific Instruments, 19 (5). 323-330 doi:10.1063/1.1741258
Evans, Howard T. (1953) Use of a Geiger Counter for the Measurement of X‐Ray Intensities from Small Single Crystals. Review of Scientific Instruments, 24 (2). 156-161 doi:10.1063/1.1770645
 
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