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Fang, L., Ricou, P., Korotkov, R. (2013) High Resolution Transmission Electron Microscopy and Selected Area Diffraction Study of Doped Zinc Oxide Thin Film. Microscopy and Microanalysis, 19. 1958-1959 doi:10.1017/s1431927613011781

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Reference TypeJournal (article/letter/editorial)
TitleHigh Resolution Transmission Electron Microscopy and Selected Area Diffraction Study of Doped Zinc Oxide Thin Film
JournalMicroscopy and Microanalysis
AuthorsFang, L.Author
Ricou, P.Author
Korotkov, R.Author
Year2013 (August)Volume19
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927613011781Search in ResearchGate
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Mindat Ref. ID4865014Long-form Identifiermindat:1:5:4865014:8
GUID0
Full ReferenceFang, L., Ricou, P., Korotkov, R. (2013) High Resolution Transmission Electron Microscopy and Selected Area Diffraction Study of Doped Zinc Oxide Thin Film. Microscopy and Microanalysis, 19. 1958-1959 doi:10.1017/s1431927613011781
Plain TextFang, L., Ricou, P., Korotkov, R. (2013) High Resolution Transmission Electron Microscopy and Selected Area Diffraction Study of Doped Zinc Oxide Thin Film. Microscopy and Microanalysis, 19. 1958-1959 doi:10.1017/s1431927613011781
In(2013) Microscopy and Microanalysis Vol. 19. Cambridge University Press (CUP)

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Fang, L, Korotkov, R (2010) Conductive Atomic Force Microscopy Study of Doped Tin Oxide Thin Film. Microscopy and Microanalysis, 16. 1562-1563 doi:10.1017/s1431927610053511
Liu, Delu (2013) Features of the ISO-25498: Method of Selected Area Electron Diffraction Analysis in Transmission Electron Microscopy. Microscopy and Microanalysis, 19. 207-209 doi:10.1017/s1431927613012671
Garcia, C.B., Ariza, E., Tavares, C.J. (2013) Application of Electron Backscatter Diffraction (EBSD) for Crystallographic Characterization of Aluminum-Doped Zinc Oxide Sputtered Films. Microscopy and Microanalysis, 19. 103-104 doi:10.1017/s143192761300113x
Lu, P., Chen, K., Zhang, X., Shan, Z. (2013) Unraveling the Coarsening Mechanism of Palladium Nanoparticles Using in situ High Resolution Transmission Electron Microscopy. Microscopy and Microanalysis, 19. 1542-1543 doi:10.1017/s1431927613009707
Urban, K.W., Jia, C.-L. (2013) Measuring Atoms in Oxide Heterostructures by Quantitative Aberration-Corrected Transmission Electron Microscopy. Microscopy and Microanalysis, 19. 584-585 doi:10.1017/s1431927613004911
Egerton, R. (2013) Pros and Cons of Low-kV Transmission Electron Microscopy. Microscopy and Microanalysis, 19. 1212-1213 doi:10.1017/s1431927613008052
Kaiser, U., Chuvilin, A., Brown, P.D., Richter, W. (1999) Origin of Threefold Periodicity in High-Resolution Transmission Electron Microscopy Images of Thin Film Cubic SiC. Microscopy and Microanalysis, 5 (6). 420-427 doi:10.1017/s1431927699990487
Rafiq, M.A., Costa, M.E., Reaney, I.M., Vilarinho, P.M. (2013) Transmission Electron Microscopy of Mn-doped KNN Ceramics. Microscopy and Microanalysis, 19. 99-100 doi:10.1017/s1431927613001116
Lan, Y., Wang, H., Chen, G., Ren, Z. (2013) Internal Temperature Calibration at Nanoscale on in situ Heating High Resolution Transmission Electron Microscopy. Microscopy and Microanalysis, 19. 498-499 doi:10.1017/s1431927613004480
Asthana, A., Yap, Y., Yassar, R. (2012) A Study on the Field Emission Property of Zinc Oxide Nanobelts by Insitu Transmission Electron Microscopy. Microscopy and Microanalysis, 18. 1870-1871 doi:10.1017/s1431927612011208
Bell, D.C. (2013) Application of Low Voltage Transmission Electron Microscopy. Microscopy and Microanalysis, 19. 1208-1209 doi:10.1017/s1431927613008039
 
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