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Chen, Delphic, Kuo, Jui-Chao (2013) The Effect of Atomic Mass on the Physical Spatial Resolution in EBSD. Microscopy and Microanalysis, 19. 4-7 doi:10.1017/s143192761301221x

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Reference TypeJournal (article/letter/editorial)
TitleThe Effect of Atomic Mass on the Physical Spatial Resolution in EBSD
JournalMicroscopy and Microanalysis
AuthorsChen, DelphicAuthor
Kuo, Jui-ChaoAuthor
Year2013 (August)Volume19
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s143192761301221xSearch in ResearchGate
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Mindat Ref. ID4865144Long-form Identifiermindat:1:5:4865144:8
GUID0
Full ReferenceChen, Delphic, Kuo, Jui-Chao (2013) The Effect of Atomic Mass on the Physical Spatial Resolution in EBSD. Microscopy and Microanalysis, 19. 4-7 doi:10.1017/s143192761301221x
Plain TextChen, Delphic, Kuo, Jui-Chao (2013) The Effect of Atomic Mass on the Physical Spatial Resolution in EBSD. Microscopy and Microanalysis, 19. 4-7 doi:10.1017/s143192761301221x
In(2013) Microscopy and Microanalysis Vol. 19. Cambridge University Press (CUP)

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Chen, Delphic, Kuo, Jui-Chao, Wu, Wen-Tuan (2011) Effect of microscopic parameters on EBSD spatial resolution. Ultramicroscopy, 111 (9). 1488-1494 doi:10.1016/j.ultramic.2011.06.007
Chen, Delphic, Kuo, Jui-Chao (2010) Bilateral filter based orientation smoothing of EBSD data. Ultramicroscopy, 110 (10). 1297-1305 doi:10.1016/j.ultramic.2010.06.003
Field, D P (2005) Improving the Spatial Resolution of EBSD. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605506445
Lui, Guan-Tai, Chen, Delphic, Kuo, Jui-Chao (2009) EBSD characterization of twinned copper using pulsed electrodeposition. Journal of Physics D: Applied Physics, 42. 215410pp. doi:10.1088/0022-3727/42/21/215410
Rinaldi, Romano (2013) Introduction: EBSD at the 10th EMAS Regional Workshop on Electron Probe Microanalysis of Materials Today: Practical Aspects. Microscopy and Microanalysis, 19 (4). 919 doi:10.1017/s1431927613001967
Sitzman, Scott (2018) Tutorial: Ultra-high Spatial Resolution EBSD: Transmission Kikuchi Diffraction (TKD) in the SEM. Microscopy and Microanalysis, 24. 2324-2325 doi:10.1017/s1431927618012102
Lin, Ya Wen, Kuo, Jui Chao, Lui, Kuan Tai, Chen, Delphic (2010) Effect of Plating Current Density and Frequency on the Crystallographic Texture of Electrodeposited Copper. Materials Science Forum, 638. 2841-2845 doi:10.4028/www.scientific.net/msf.638-642.2841
Sitzman, S. (2013) The Rise of EBSD for Modern Quantitative Metallography. Microscopy and Microanalysis, 19. 1772-1773 doi:10.1017/s1431927613010854
Rose, H.H. (2013) The Long-Lasting Struggle to Achieve Atomic-Resolution Microscopy by Correcting the Aberrations of Electron Lenses. Microscopy and Microanalysis, 19. 2006-2007 doi:10.1017/s1431927613012026
Dycus, J.H. (2013) Resolving Ambiguities at the Bi2Te3/GaAs Interface with Atomic Resolution EDS. Microscopy and Microanalysis, 19. 1140-1141 doi:10.1017/s1431927613007691
O'Keefe, M.A., Allard, L.F., Blom, D.A. (2013) Resolution of the Electron Microscope at the Atomic Scale. Microscopy and Microanalysis, 19. 592-593 doi:10.1017/s1431927613004959
 
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