Reference Type | Journal (article/letter/editorial) |
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Title | Quantification of Ridging in Ferritic Stainless Steel Sheets by Electron Backscattered Diffraction R-Value Maps |
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Journal | Microscopy and Microanalysis |
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Authors | Lee, Kye-Man | Author |
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Park, Jieon | Author |
Kim, Sangseok | Author |
Park, Sooho | Author |
Huh, Moo-Young | Author |
Year | 2013 (August) | Volume | 19 |
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Publisher | Cambridge University Press (CUP) |
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DOI | doi:10.1017/s1431927613012245Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 4865151 | Long-form Identifier | mindat:1:5:4865151:8 |
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GUID | 0 |
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Full Reference | Lee, Kye-Man, Park, Jieon, Kim, Sangseok, Park, Sooho, Huh, Moo-Young (2013) Quantification of Ridging in Ferritic Stainless Steel Sheets by Electron Backscattered Diffraction R-Value Maps. Microscopy and Microanalysis, 19. 17-20 doi:10.1017/s1431927613012245 |
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Plain Text | Lee, Kye-Man, Park, Jieon, Kim, Sangseok, Park, Sooho, Huh, Moo-Young (2013) Quantification of Ridging in Ferritic Stainless Steel Sheets by Electron Backscattered Diffraction R-Value Maps. Microscopy and Microanalysis, 19. 17-20 doi:10.1017/s1431927613012245 |
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In | (2013) Microscopy and Microanalysis Vol. 19. Cambridge University Press (CUP) |
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