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Armigliato, Aldo, Frabboni, Stefano, Gazzadi, Gian Carlo, Rosa, Rodolfo (2013) FIB Preparation of a NiO Wedge-Lamella and STEM X-Ray Microanalysis for the Determination of the Experimental k(O-Ni) Cliff-Lorimer Coefficient. Microscopy and Microanalysis, 19 (1). 79-84 doi:10.1017/s1431927612013876

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Reference TypeJournal (article/letter/editorial)
TitleFIB Preparation of a NiO Wedge-Lamella and STEM X-Ray Microanalysis for the Determination of the Experimental k(O-Ni) Cliff-Lorimer Coefficient
JournalMicroscopy and Microanalysis
AuthorsArmigliato, AldoAuthor
Frabboni, StefanoAuthor
Gazzadi, Gian CarloAuthor
Rosa, RodolfoAuthor
Year2013 (February)Volume19
Issue1
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927612013876Search in ResearchGate
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Mindat Ref. ID4865474Long-form Identifiermindat:1:5:4865474:6
GUID0
Full ReferenceArmigliato, Aldo, Frabboni, Stefano, Gazzadi, Gian Carlo, Rosa, Rodolfo (2013) FIB Preparation of a NiO Wedge-Lamella and STEM X-Ray Microanalysis for the Determination of the Experimental k(O-Ni) Cliff-Lorimer Coefficient. Microscopy and Microanalysis, 19 (1). 79-84 doi:10.1017/s1431927612013876
Plain TextArmigliato, Aldo, Frabboni, Stefano, Gazzadi, Gian Carlo, Rosa, Rodolfo (2013) FIB Preparation of a NiO Wedge-Lamella and STEM X-Ray Microanalysis for the Determination of the Experimental k(O-Ni) Cliff-Lorimer Coefficient. Microscopy and Microanalysis, 19 (1). 79-84 doi:10.1017/s1431927612013876
In(2013, February) Microscopy and Microanalysis Vol. 19 (1) Cambridge University Press (CUP)

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Armigliato, Aldo, Frabboni, Stefano, Carlo Gazzadi, Gian, Rosa, Rodolfo (2014) Quantitative X-Ray Microanalysis of Thin NiO Films by Monte Carlo and Cliff-Lorimer Methods. Microscopy Today, 22 (2). 28-35 doi:10.1017/s1551929514000054
Parisini, Andrea, Frabboni, Stefano, Gazzadi, Gian Carlo, Rosa, Rodolfo, Armigliato, Aldo (2018) Comparison of Cliff–Lorimer-Based Methods of Scanning Transmission Electron Microscopy (STEM) Quantitative X-Ray Microanalysis for Application to Silicon Oxycarbides Thin Films. Microscopy and Microanalysis, 24 (3). 193-206 doi:10.1017/s1431927618000259
Armigliato, Aldo, Balboni, Roberto, Rosa, Rodolfo (2006) Quantitative Thin-Film X-ray Microanalysis by STEM/HAADF: Statistical Analysis for Precision and Accuracy Determination. Microscopy and Microanalysis, 12 (4). 318-321 doi:10.1017/s1431927606060405
Armigliato, Aldo, Rosa, Rodolfo (2009) X-Ray Microanalysis Combined with Monte Carlo Simulation for the Analysis of Layered Thin Films: The Case of Carbon Contamination. Microscopy and Microanalysis, 15 (2). 99-105 doi:10.1017/s1431927609090199
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Grillo, Vincenzo, Karimi, Ebrahim, Balboni, Roberto, Carlo Gazzadi, Gian, Frabboni, Stefano, Mafakheri, Erfan, Boyd, Robert W. (2014) Innovative Phase Plates for Beam Shaping. Microscopy and Microanalysis, 20. 228-229 doi:10.1017/s1431927614002864
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ARMIGLIATO, ALDO, BALBONI, ROBERTO, ROSA, RODOLFO (2007) Application of the parametric bootstrap method to determine statistical errors in quantitative X-ray microanalysis of thin films. Journal of Microscopy, 228 (1). 1-10 doi:10.1111/j.1365-2818.2007.01817.x
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