Reference Type | Journal (article/letter/editorial) |
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Title | A high‐temperature Bonse–Hart ultrasmall‐angle x‐ray scattering instrument |
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Journal | Review of Scientific Instruments |
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Authors | Chu, Benjamin | Author |
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Li, Yingjie | Author |
Harney, Paul J. | Author |
Yeh, Fengji | Author |
Year | 1993 (June) | Volume | 64 |
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Issue | 6 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.1144465Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 4865482 | Long-form Identifier | mindat:1:5:4865482:5 |
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GUID | 0 |
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Full Reference | Chu, Benjamin, Li, Yingjie, Harney, Paul J., Yeh, Fengji (1993) A high‐temperature Bonse–Hart ultrasmall‐angle x‐ray scattering instrument. Review of Scientific Instruments, 64 (6). 1510-1514 doi:10.1063/1.1144465 |
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Plain Text | Chu, Benjamin, Li, Yingjie, Harney, Paul J., Yeh, Fengji (1993) A high‐temperature Bonse–Hart ultrasmall‐angle x‐ray scattering instrument. Review of Scientific Instruments, 64 (6). 1510-1514 doi:10.1063/1.1144465 |
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In | (1993, June) Review of Scientific Instruments Vol. 64 (6) AIP Publishing |
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