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Ramachandra, Ranjan, Demers, Hendrix, de Jonge, Niels (2013) The Influence of the Sample Thickness on the Lateral and Axial Resolution of Aberration-Corrected Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 19 (1). 93-101 doi:10.1017/s143192761201392x

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Reference TypeJournal (article/letter/editorial)
TitleThe Influence of the Sample Thickness on the Lateral and Axial Resolution of Aberration-Corrected Scanning Transmission Electron Microscopy
JournalMicroscopy and Microanalysis
AuthorsRamachandra, RanjanAuthor
Demers, HendrixAuthor
de Jonge, NielsAuthor
Year2013 (February)Volume19
Issue1
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s143192761201392xSearch in ResearchGate
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Mindat Ref. ID4865491Long-form Identifiermindat:1:5:4865491:3
GUID0
Full ReferenceRamachandra, Ranjan, Demers, Hendrix, de Jonge, Niels (2013) The Influence of the Sample Thickness on the Lateral and Axial Resolution of Aberration-Corrected Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 19 (1). 93-101 doi:10.1017/s143192761201392x
Plain TextRamachandra, Ranjan, Demers, Hendrix, de Jonge, Niels (2013) The Influence of the Sample Thickness on the Lateral and Axial Resolution of Aberration-Corrected Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 19 (1). 93-101 doi:10.1017/s143192761201392x
In(2013, February) Microscopy and Microanalysis Vol. 19 (1) Cambridge University Press (CUP)

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Demers, Hendrix, Ramachandra, Ranjan, Drouin, Dominique, de Jonge, Niels (2012) The Probe Profile and Lateral Resolution of Scanning Transmission Electron Microscopy of Thick Specimens. Microscopy and Microanalysis, 18 (3). 582-590 doi:10.1017/s1431927612000232
Ramachandra, Ranjan, de Jonge, Niels (2012) Optimized Deconvolution for Maximum Axial Resolution in Three-Dimensional Aberration-Corrected Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 18 (1). 218-228 doi:10.1017/s1431927611012347
de Jonge, Niels, Verch, Andreas, Demers, Hendrix (2018) The Influence of Beam Broadening on the Spatial Resolution of Annular Dark Field Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 24 (1). 8-16 doi:10.1017/s1431927618000077
Ramachandra, Ranjan, Demers, Hendrix, de Jonge, Niels (2011) Atomic-resolution scanning transmission electron microscopy through 50-nm-thick silicon nitride membranes. Applied Physics Letters, 98 (9). 93109pp. doi:10.1063/1.3561758
de Jonge, N, Ramachandra, R, Northan, BM, Poirier-Demers, N, Drouin, D (2010) Three-Dimensional Aberration-Corrected Scanning Transmission Electron Microscopy of Biological Specimens. Microscopy and Microanalysis, 16. 848-849 doi:10.1017/s1431927610055753
Lupini, Andrew R., de Jonge, Niels (2011) The Three-Dimensional Point Spread Function of Aberration-Corrected Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 17 (5). 817-826 doi:10.1017/s1431927611011913
de Jonge, Niels (2018) Sample Dependent Resolution of Transmission Electron Microscopy in Water or Ice. Microscopy and Microanalysis, 24. 1978-1979 doi:10.1017/s1431927618010371
Liu, J. (2013) Single Atom and Cluster Catalysis: The Era of Aberration-corrected Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 19. 1678-1679 doi:10.1017/s1431927613010386
Verch, Andreas, Jonge, Niels de (2016) Depth Dependence of the Spatial Resolution in Scanning Transmission Electron Microscopy Experiments. Microscopy and Microanalysis, 22. 802-803 doi:10.1017/s1431927616004864
Baudoin, Jean-Pierre, Jinschek, Joerg R., Boothroyd, Chris B., Dunin-Borkowski, Rafal E., de Jonge, Niels (2013) Chromatic Aberration-Corrected Tilt Series Transmission Electron Microscopy of Nanoparticles in a Whole Mount Macrophage Cell. Microscopy and Microanalysis, 19 (4). 814-820 doi:10.1017/s1431927613001475
Ortega, Eduardo, de Jonge, Niels (2022) Sparsity and Noise Effects on the Reconstruction of Subsampled Scanning Transmission Electron Microscopy Data. Microscopy and Microanalysis, 28. 2136-2137 doi:10.1017/s1431927622008273
 
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