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Brisset, François, Helbert, Anne-Laure, Baudin, Thierry (2013) In Situ Electron Backscatter Diffraction Investigation of Recrystallization in a Copper Wire. Microscopy and Microanalysis, 19 (4). 969-977 doi:10.1017/s1431927613000299

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Reference TypeJournal (article/letter/editorial)
TitleIn Situ Electron Backscatter Diffraction Investigation of Recrystallization in a Copper Wire
JournalMicroscopy and Microanalysis
AuthorsBrisset, FrançoisAuthor
Helbert, Anne-LaureAuthor
Baudin, ThierryAuthor
Year2013 (August)Volume19
Issue4
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927613000299Search in ResearchGate
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Mindat Ref. ID4865762Long-form Identifiermindat:1:5:4865762:8
GUID0
Full ReferenceBrisset, François, Helbert, Anne-Laure, Baudin, Thierry (2013) In Situ Electron Backscatter Diffraction Investigation of Recrystallization in a Copper Wire. Microscopy and Microanalysis, 19 (4). 969-977 doi:10.1017/s1431927613000299
Plain TextBrisset, François, Helbert, Anne-Laure, Baudin, Thierry (2013) In Situ Electron Backscatter Diffraction Investigation of Recrystallization in a Copper Wire. Microscopy and Microanalysis, 19 (4). 969-977 doi:10.1017/s1431927613000299
In(2013, August) Microscopy and Microanalysis Vol. 19 (4) Cambridge University Press (CUP)


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