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Jones, Lewys, Nellist, Peter D. (2013) Identifying and Correcting Scan Noise and Drift in the Scanning Transmission Electron Microscope. Microscopy and Microanalysis, 19 (4). 1050-1060 doi:10.1017/s1431927613001402

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Reference TypeJournal (article/letter/editorial)
TitleIdentifying and Correcting Scan Noise and Drift in the Scanning Transmission Electron Microscope
JournalMicroscopy and Microanalysis
AuthorsJones, LewysAuthor
Nellist, Peter D.Author
Year2013 (August)Volume19
Issue4
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927613001402Search in ResearchGate
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Mindat Ref. ID4865787Long-form Identifiermindat:1:5:4865787:7
GUID0
Full ReferenceJones, Lewys, Nellist, Peter D. (2013) Identifying and Correcting Scan Noise and Drift in the Scanning Transmission Electron Microscope. Microscopy and Microanalysis, 19 (4). 1050-1060 doi:10.1017/s1431927613001402
Plain TextJones, Lewys, Nellist, Peter D. (2013) Identifying and Correcting Scan Noise and Drift in the Scanning Transmission Electron Microscope. Microscopy and Microanalysis, 19 (4). 1050-1060 doi:10.1017/s1431927613001402
In(2013, August) Microscopy and Microanalysis Vol. 19 (4) Cambridge University Press (CUP)

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Jones, Lewys (2014) Scan-noise and Drift Correction in the STEM. Microscopy Today, 22 (3). 40-41 doi:10.1017/s1551929514000376
Jones, Lewys, Wenner, Sigurd, Nord, Magnus, Harald Ninive, Per, Martin Løvvik, Ole, Marioara, Calin D., Holmestad, Randi, Nellist, Peter D. (2017) Mapping the Chemistry Within, and the Strain Around, Al-alloy Precipitates at Atomic Resolution by Multi-frame Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 23. 384-385 doi:10.1017/s1431927617002604
Pennycook, S.J., Rafferty, B., Nellist, P.D. (2000) Z-contrast Imaging in an Aberration-corrected Scanning Transmission Electron Microscope. Microscopy and Microanalysis, 6 (4). 343-352 doi:10.1017/s1431927602000594
Yang, Hao, Ophus, Colin, Ercius, Peter, Nellist, Peter D. (2016) Enhanced Phase Contrast Transfer using Ptychography Combined with a Pre-Specimen Phase Plate in a Scanning Transmission Electron Microscope. Microscopy and Microanalysis, 22. 462-463 doi:10.1017/s1431927616003160
Herring, R.A., Hoyle, D., Taniguchi, Y., Haider, M. (2013) The Ultra-stable Scanning Transmission Electron Holography Microscope. Microscopy and Microanalysis, 19. 320-321 doi:10.1017/s1431927613003590
Wang, P, Behan, G, Kirkland, AI, Nellist, P (2009) Energy Filtered Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope. Microscopy and Microanalysis, 15. 42-43 doi:10.1017/s1431927609094069
Pennycook, Timothy J., Lupini, Andrew R., Jones, Lewys, Nellist, Peter D. (2014) Maximum Efficiency STEM Phase Contrast Imaging. Microscopy and Microanalysis, 20. 382-383 doi:10.1017/s1431927614003638
Pennycook, Timothy J., Jones, Lewys, Pettersson, Henrik, Nicolosi, Valeria, Nellist, Peter D. (2014) Probing Atomic Scale Dynamics with STEM. Microscopy and Microanalysis, 20. 104-105 doi:10.1017/s1431927614002244
Nellist, P.D., Cosgriff, E.C., Behan, G., Kirkland, A.I. (2008) Imaging Modes for Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope. Microscopy and Microanalysis, 14 (1). 82-88 doi:10.1017/s1431927608080057
Mullerova, I., Mikmekova, E., Konvalina, I., Frank, L. (2013) Low Energy Scanning Transmission Electron Microscope. Microscopy and Microanalysis, 19. 1236-1237 doi:10.1017/s1431927613008179
O'Leary, Colum M., Haas, Benedikt, Koch, Christoph T., Nellist, Peter D., Jones, Lewys (2022) Increasing Spatial Fidelity and SNR of 4D-STEM Using Multi-Frame Data Fusion. Microscopy and Microanalysis, 28 (4) 1417-1427 doi:10.1017/s1431927621012587
 
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