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Xin, Huolin L., Dwyer, Christian, Muller, David A., Zheng, Haimei, Ercius, Peter (2013) Scanning Confocal Electron Energy-Loss Microscopy Using Valence-Loss Signals. Microscopy and Microanalysis, 19 (4). 1036-1049 doi:10.1017/s1431927613001438

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Reference TypeJournal (article/letter/editorial)
TitleScanning Confocal Electron Energy-Loss Microscopy Using Valence-Loss Signals
JournalMicroscopy and Microanalysis
AuthorsXin, Huolin L.Author
Dwyer, ChristianAuthor
Muller, David A.Author
Zheng, HaimeiAuthor
Ercius, PeterAuthor
Year2013 (August)Volume19
Issue4
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927613001438Search in ResearchGate
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Mindat Ref. ID4865797Long-form Identifiermindat:1:5:4865797:4
GUID0
Full ReferenceXin, Huolin L., Dwyer, Christian, Muller, David A., Zheng, Haimei, Ercius, Peter (2013) Scanning Confocal Electron Energy-Loss Microscopy Using Valence-Loss Signals. Microscopy and Microanalysis, 19 (4). 1036-1049 doi:10.1017/s1431927613001438
Plain TextXin, Huolin L., Dwyer, Christian, Muller, David A., Zheng, Haimei, Ercius, Peter (2013) Scanning Confocal Electron Energy-Loss Microscopy Using Valence-Loss Signals. Microscopy and Microanalysis, 19 (4). 1036-1049 doi:10.1017/s1431927613001438
In(2013, August) Microscopy and Microanalysis Vol. 19 (4) Cambridge University Press (CUP)

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Xin, H.L., Zheng, H., Ercius, P., Dwyer, C., Muller, D.A. (2012) Scanning Confocal Electron Energy Loss Microscopy in TEAM 1.0 with Post-Specimen Cc Correction. Microscopy and Microanalysis, 18. 400-401 doi:10.1017/s1431927612003856
Xin, H.L., Zheng, H., Ercius, P. (2013) Post-Specimen Cc Correction Enabled Scanning Confocal Electron Energy Loss Microscopy for High-Throughput 3-D Spectroscopic Imaging of Nanomaterials. Microscopy and Microanalysis, 19. 536-537 doi:10.1017/s1431927613004674
Ercius, P., Xin, H.L., Zheng, H., Dwyer, C. (2012) Quantitative Confocal Sectioning in Double-Corrected STEM Utilizing Electron Energy Loss Spectroscopy and Post-Specimen Cc Correction. Microscopy and Microanalysis, 18. 1026-1027 doi:10.1017/s1431927612006988
Xin, Huolin L., Tan, Haiyan, Dwyer, Christian, Zhu, Ye (2016) Quantification and Sensible Correction for Energy-Loss- and Thickness-Dependent Contrast Complications in Atomic-Scale Electron Energy-Loss Spectroscopy. Microscopy and Microanalysis, 22. 886-887 doi:10.1017/s1431927616005274
Cueva, Paul, Hovden, Robert, Mundy, Julia A., Xin, Huolin L., Muller, David A. (2012) Data Processing for Atomic Resolution Electron Energy Loss Spectroscopy. Microscopy and Microanalysis, 18 (4). 667-675 doi:10.1017/s1431927612000244
Hovden, Robert, Xin, Huolin L., Muller, David A. (2011) Extended Depth of Field for High-Resolution Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 17 (1). 75-80 doi:10.1017/s1431927610094171
Chang, Shery, Wen, Haotian, Kordahl, David, Dwyer, Christian (2021) Measuring NV Centers in Diamond Nanoparticles using Electron Energy Loss Spectroscopy. Microscopy and Microanalysis, 27. 1194-1195 doi:10.1017/s1431927621004499
Xin, Huolin L., Muller, David A. (2010) Three-Dimensional Imaging in Aberration-Corrected Electron Microscopes. Microscopy and Microanalysis, 16 (4). 445-455 doi:10.1017/s1431927610093360
Holtz, Megan E., Yu, Yingchao, Gao, Jie, Abruña, Héctor D., Muller, David A. (2013) In Situ Electron Energy-Loss Spectroscopy in Liquids. Microscopy and Microanalysis, 19 (4). 1027-1035 doi:10.1017/s1431927613001505
Muller, Alexander, Deblonde, Gauthier J.-P., Ercius, Peter, Abergel, Rebecca J., Minor, Andrew M. (2018) Electron Energy Loss Spectroscopy of Actinides at the Nanogram Scale. Microscopy and Microanalysis, 24. 444-445 doi:10.1017/s1431927618002714
Xin, Huolin L., Zheng, Haimei (2012) On-Column 2p Bound State with Topological Charge ±1 Excited by an Atomic-Size Vortex Beam in an Aberration-Corrected Scanning Transmission Electron Microscope. Microscopy and Microanalysis, 18 (4). 711-719 doi:10.1017/s1431927612000499
 
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