Yang, Yongsoo, Chen, Chien-Chun, Scott, M. C., Ophus, Colin, Xu, Rui, Pryor, Alan, Wu, Li, Sun, Fan, Theis, Wolfgang, Zhou, Jihan, Eisenbach, Markus, Kent, Paul R. C., Sabirianov, Renat F., Zeng, Hao, Ercius, Peter, Miao, Jianwei (2017) Atomic Electron Tomography: Probing 3D Structure and Material Properties at the Single-Atom Level. Microscopy and Microanalysis, 23. 1886-1887 doi:10.1017/s1431927617010091
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Atomic Electron Tomography: Probing 3D Structure and Material Properties at the Single-Atom Level | ||
| Journal | Microscopy and Microanalysis | ||
| Authors | Yang, Yongsoo | Author | |
| Chen, Chien-Chun | Author | ||
| Scott, M. C. | Author | ||
| Ophus, Colin | Author | ||
| Xu, Rui | Author | ||
| Pryor, Alan | Author | ||
| Wu, Li | Author | ||
| Sun, Fan | Author | ||
| Theis, Wolfgang | Author | ||
| Zhou, Jihan | Author | ||
| Eisenbach, Markus | Author | ||
| Kent, Paul R. C. | Author | ||
| Sabirianov, Renat F. | Author | ||
| Zeng, Hao | Author | ||
| Ercius, Peter | Author | ||
| Miao, Jianwei | Author | ||
| Year | 2017 (July) | Volume | 23 |
| Publisher | Cambridge University Press (CUP) | ||
| DOI | doi:10.1017/s1431927617010091Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 4881446 | Long-form Identifier | mindat:1:5:4881446:3 |
| GUID | 0 | ||
| Full Reference | Yang, Yongsoo, Chen, Chien-Chun, Scott, M. C., Ophus, Colin, Xu, Rui, Pryor, Alan, Wu, Li, Sun, Fan, Theis, Wolfgang, Zhou, Jihan, Eisenbach, Markus, Kent, Paul R. C., Sabirianov, Renat F., Zeng, Hao, Ercius, Peter, Miao, Jianwei (2017) Atomic Electron Tomography: Probing 3D Structure and Material Properties at the Single-Atom Level. Microscopy and Microanalysis, 23. 1886-1887 doi:10.1017/s1431927617010091 | ||
| Plain Text | Yang, Yongsoo, Chen, Chien-Chun, Scott, M. C., Ophus, Colin, Xu, Rui, Pryor, Alan, Wu, Li, Sun, Fan, Theis, Wolfgang, Zhou, Jihan, Eisenbach, Markus, Kent, Paul R. C., Sabirianov, Renat F., Zeng, Hao, Ercius, Peter, Miao, Jianwei (2017) Atomic Electron Tomography: Probing 3D Structure and Material Properties at the Single-Atom Level. Microscopy and Microanalysis, 23. 1886-1887 doi:10.1017/s1431927617010091 | ||
| In | (2017) Microscopy and Microanalysis Vol. 23. Cambridge University Press (CUP) | ||
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