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Prosa, Ty J., Larson, David J. (2017) Modern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe Tomography. Microscopy and Microanalysis, 23 (2). 194-209 doi:10.1017/s1431927616012642

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Reference TypeJournal (article/letter/editorial)
TitleModern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe Tomography
JournalMicroscopy and Microanalysis
AuthorsProsa, Ty J.Author
Larson, David J.Author
Year2017 (April)Volume23
Issue2
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927616012642Search in ResearchGate
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Mindat Ref. ID4882019Long-form Identifiermindat:1:5:4882019:0
GUID0
Full ReferenceProsa, Ty J., Larson, David J. (2017) Modern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe Tomography. Microscopy and Microanalysis, 23 (2). 194-209 doi:10.1017/s1431927616012642
Plain TextProsa, Ty J., Larson, David J. (2017) Modern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe Tomography. Microscopy and Microanalysis, 23 (2). 194-209 doi:10.1017/s1431927616012642
In(2017, April) Microscopy and Microanalysis Vol. 23 (2) Cambridge University Press (CUP)

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Prosa, Ty J., Strennen, Savanna, Olson, David, Lawrence, Dan, Larson, David J. (2019) A Study of Parameters Affecting Atom Probe Tomography Specimen Survivability. Microscopy and Microanalysis, 25 (2). 425-437 doi:10.1017/s1431927618015258
Rice, Katherine P., Chen, Yimeng, Prosa, Ty J., Larson, David J. (2016) Implementing Transmission Electron Backscatter Diffraction for Atom Probe Tomography. Microscopy and Microanalysis, 22 (3). 583-588 doi:10.1017/s1431927616011296
Larson, David J., Geiser, Brian P., Prosa, Ty J., Kelly, Thomas F. (2012) On the Use of Simulated Field-Evaporated Specimen Apex Shapes in Atom Probe Tomography Data Reconstruction. Microscopy and Microanalysis, 18 (5). 953-963 doi:10.1017/s1431927612001523
Larson, David J., Prosa, Ty J., Reinhard, David, Ulfig, Robert M., Holman, Michael, Lenz, Dan (2022) Simultaneous Voltage and Laser Pulsing in Atom Probe Tomography. Microscopy and Microanalysis, 28. 718-720 doi:10.1017/s1431927622003336
Wiezorek, Jorg M.K., Zweiacker, Kai W., Liu, Can, Martin, Isabelle, Prosa, Ty. J., Larson, David J. (2017) Atom Probe Tomography and analytical Scanning Transmission Electron Microscopy of Rapid Solidification Microstructures in Al-Cu Alloy Thin Films. Microscopy and Microanalysis, 23. 688-689 doi:10.1017/s143192761700410x
Prosa, Ty, Lenz, Dan, Martin, Isabelle, Reinhard, David, Larson, David, Bunton, Joe (2021) Evaporation-Field Differences with Deep-UV Atom Probe Tomography. Microscopy and Microanalysis, 27. 1262-1264 doi:10.1017/s1431927621004736
Geiser, Brian, Martin, Isabelle, Reinhard, David, Lenz, Dan, Prosa, Ty, Ulfig, Robert, Larson, David (2021) Electrostatic Reconstruction Technology in Atom Probe Tomography. Microscopy and Microanalysis, 27. 2482-2483 doi:10.1017/s1431927621008850
Martin, Isabelle, Estivill, Robert, Juhel, Marc, Grenier, Adeline, Prosa, Ty J., Larson, David J. (2016) Atomic Scale Analysis of Dopants in CMOS Structures by Atom Probe Tomography. Microscopy and Microanalysis, 22. 1534-1535 doi:10.1017/s1431927616008515
Larson, David, Lenz, Dan, Martin, Isabelle, Prosa, Ty, Reinhard, David, Clifton, Peter, Geiser, Brian, Ulfig, Robert, Bunton, Joe (2021) Directions in Atom Probe Tomography. Microscopy and Microanalysis, 27. 2464-2466 doi:10.1017/s1431927621008801
Prosa, Ty J., Reinhard, David A., Francois-Saint-Cyr, H.G., Martin, Isabelle, Rice, Katherine P., Chen, Yimeng, Larson, David J. (2017) Evolution of Atom Probe Data Collection Toward Optimized and Fully Automated Acquisition. Microscopy and Microanalysis, 23. 616-617 doi:10.1017/s1431927617003750
Prakash Kolli, R., Meisenkothen, Frederick (2014) A Focused Ion Beam Specimen Preparation Method to Minimize Gallium Ion Concentration in Copper Atom-Probe Tomography Specimen Tips. Microscopy and Microanalysis, 20. 350-351 doi:10.1017/s143192761400347x
 
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