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Wang, Zhili, Liu, Dalin, Ren, Kun, Shi, Xiaomin, Xia, Jianlin (2018) Single-shot X-ray Dark-field Imaging. Microscopy and Microanalysis, 24. 130-131 doi:10.1017/s143192761801303x

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Reference TypeJournal (article/letter/editorial)
TitleSingle-shot X-ray Dark-field Imaging
JournalMicroscopy and Microanalysis
AuthorsWang, ZhiliAuthor
Liu, DalinAuthor
Ren, KunAuthor
Shi, XiaominAuthor
Xia, JianlinAuthor
Year2018 (August)Volume24
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s143192761801303xSearch in ResearchGate
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Mindat Ref. ID4884889Long-form Identifiermindat:1:5:4884889:5
GUID0
Full ReferenceWang, Zhili, Liu, Dalin, Ren, Kun, Shi, Xiaomin, Xia, Jianlin (2018) Single-shot X-ray Dark-field Imaging. Microscopy and Microanalysis, 24. 130-131 doi:10.1017/s143192761801303x
Plain TextWang, Zhili, Liu, Dalin, Ren, Kun, Shi, Xiaomin, Xia, Jianlin (2018) Single-shot X-ray Dark-field Imaging. Microscopy and Microanalysis, 24. 130-131 doi:10.1017/s143192761801303x
In(2018) Microscopy and Microanalysis Vol. 24. Cambridge University Press (CUP)

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Wang, Zhili, Shi, Xiaomin, Ren, Kun, Chen, Heng, Ren, Yuqi, Gao, Kun, Wu, Zhao (2020) Transmission, refraction and dark-field retrieval in hard X-ray grating interferometry. Journal of Synchrotron Radiation, 27 (2). 494-502 doi:10.1107/s1600577519017223
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