Venables, J.A. (1981) Electron microscopy of surfaces. Ultramicroscopy, 7 (1). 108pp. doi:10.1016/0304-3991(81)90042-5

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Reference Type	Journal (article/letter/editorial)
Title	Electron microscopy of surfaces
Journal	Ultramicroscopy
Authors	Venables, J.A.		Author
Year	1981 (January)	Volume	7
Issue	1
Publisher	Elsevier BV
DOI	doi:10.1016/0304-3991(81)90042-5Search in ResearchGate
	Generate Citation Formats
Mindat Ref. ID	4890206	Long-form Identifier	mindat:1:5:4890206:9
GUID	0
Full Reference	Venables, J.A. (1981) Electron microscopy of surfaces. Ultramicroscopy, 7 (1). 108pp. doi:10.1016/0304-3991(81)90042-5
Plain Text	Venables, J.A. (1981) Electron microscopy of surfaces. Ultramicroscopy, 7 (1). 108pp. doi:10.1016/0304-3991(81)90042-5
In	(1981, January) Ultramicroscopy Vol. 7 (1) Elsevier BV

	*Venables, J.A. (1981) Electron microscopy of surfaces. Ultramicroscopy, 7 (1). 81-98 doi:10.1016/0304-3991(81)90026-7*
	*(1981) Surface studies using stem. Ultramicroscopy, 7 (1). 108pp. doi:10.1016/0304-3991(81)90043-7*
	*Humphreys, C.J., Payne, S.M. (1981) Wavon radiation in electron diffraction. Ultramicroscopy, 7 (1). 108pp. doi:10.1016/0304-3991(81)90041-3*
	*Hembree, G.G., Venables, J.A. (1992) Nanometer-resolution scanning Auger electron microscopy. Ultramicroscopy, 47 (1). 109-120 doi:10.1016/0304-3991(92)90188-p*
	*Raynerd, G., Venables, J.A. (1987) Transmission electron diffraction and microscopy of condensed sulphur hexaflouride. Ultramicroscopy, 23 (3). 433-442 doi:10.1016/0304-3991(87)90254-3*
	*Cowley, J.M. (1981) Electron microdiffraction studies of the potential field at crystal surfaces. Ultramicroscopy, 7 (2). 181-188 doi:10.1016/0304-3991(81)90008-5*
	*Venables, J.A., Janssen, A.P. (1980) Performance of a field emission gun scanning electron microscope column. Ultramicroscopy, 5 (1). 297-315 doi:10.1016/0304-3991(80)90034-0*
	*Venables, J.A. (1988) Surface studies with scanning electron microscopies. Ultramicroscopy, 24 (4). 449pp. doi:10.1016/0304-3991(88)90203-3*
	*Doust, T., Metcalfe, F.L., Venables, J.A. (1989) Biassed secondary electron imaging studies of Ag/Si(111). Ultramicroscopy, 31 (1). 116-123 doi:10.1016/0304-3991(89)90041-7*
	*Pande, C.S., Sabatini, R.L. (1981) Orientation effects in X-ray production from ordered intermetallic alloys. Ultramicroscopy, 7 (1). 108pp. doi:10.1016/0304-3991(81)90040-1*
	*Harland, C.J., Venables, J.A. (1985) Digital data acquisition, display and analysis of signals from surfaces. Ultramicroscopy, 17 (1). 9-19 doi:10.1016/0304-3991(85)90172-x*

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Venables, J.A. (1981) Electron microscopy of surfaces. Ultramicroscopy, 7 (1). 108pp. doi:10.1016/0304-3991(81)90042-5

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