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K. Garg, Raj (1982) A simple and practical approach to correct spherical aberration in existing electron probe microscopes. Ultramicroscopy, 7 (4). 411-413 doi:10.1016/0304-3991(82)90264-9

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Reference TypeJournal (article/letter/editorial)
TitleA simple and practical approach to correct spherical aberration in existing electron probe microscopes
JournalUltramicroscopy
AuthorsK. Garg, RajAuthor
Year1982 (January)Volume7
Issue4
PublisherElsevier BV
DOIdoi:10.1016/0304-3991(82)90264-9Search in ResearchGate
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Mindat Ref. ID4890302Long-form Identifiermindat:1:5:4890302:2
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Full ReferenceK. Garg, Raj (1982) A simple and practical approach to correct spherical aberration in existing electron probe microscopes. Ultramicroscopy, 7 (4). 411-413 doi:10.1016/0304-3991(82)90264-9
Plain TextK. Garg, Raj (1982) A simple and practical approach to correct spherical aberration in existing electron probe microscopes. Ultramicroscopy, 7 (4). 411-413 doi:10.1016/0304-3991(82)90264-9
In(1982, January) Ultramicroscopy Vol. 7 (4) Elsevier BV

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Scherzer, O. (1982) How not to correct an electron lens. Ultramicroscopy, 9 (4). 385pp. doi:10.1016/0304-3991(82)90100-0
Alapieti, T., Sivonen, S.J. (1982) The electron probe microanalyzer as a tool in geological research. Ultramicroscopy, 9 (4). 398-399 doi:10.1016/0304-3991(82)90114-0
Kettunen, PenttiO. (1982) Electron microscopy in materials. Ultramicroscopy, 9 (4). 393pp. doi:10.1016/0304-3991(82)90103-6
Mellema, J.E. (1982) The electron microscope as a measuring machine in biological structure research. Ultramicroscopy, 9 (4). 423pp. doi:10.1016/0304-3991(82)90157-7
(1982) Editorial. Ultramicroscopy, 9 (4). doi:10.1016/0304-3991(82)90092-4
Dubochet, J. (1982) Electron microscopy at 4K. Ultramicroscopy, 9 (4). 414pp. doi:10.1016/0304-3991(82)90138-3
Koster, A.J., de Jong, A.F. (1991) Measurement of the spherical aberration coefficient of transmission electron microscopes by beam-tilt-induced image displacements. Ultramicroscopy, 38 (3). 235-240 doi:10.1016/0304-3991(91)90158-3
Suoninen, Eero (1982) Applications of electron spectroscopy in materials science. Ultramicroscopy, 9 (4). 399pp. doi:10.1016/0304-3991(82)90115-2
(1982) Author index to volume 9. Ultramicroscopy, 9 (4). 429-431 doi:10.1016/0304-3991(82)90166-8
(1982) Subject index to volume 9. Ultramicroscopy, 9 (4). 432-434 doi:10.1016/0304-3991(82)90167-x
(1982) Author index to volume 7. Ultramicroscopy, 7 (4). 415-416 doi:10.1016/0304-3991(82)90265-0
 
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