Reference Type | Journal (article/letter/editorial) |
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Title | Nonlinear high resolution image processing of conventional transmission electron micrographs |
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Journal | Ultramicroscopy |
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Authors | Kirkland, Earl J. | Author |
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Siegel, B.M. | Author |
Uyeda, N. | Author |
Fujiyoshi, Y. | Author |
Year | 1982 (January) | Volume | 9 |
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Issue | 1 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/0304-3991(82)90229-7Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 4890498 | Long-form Identifier | mindat:1:5:4890498:8 |
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GUID | 0 |
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Full Reference | Kirkland, Earl J., Siegel, B.M., Uyeda, N., Fujiyoshi, Y. (1982) Nonlinear high resolution image processing of conventional transmission electron micrographs. Ultramicroscopy, 9 (1). 65-74 doi:10.1016/0304-3991(82)90229-7 |
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Plain Text | Kirkland, Earl J., Siegel, B.M., Uyeda, N., Fujiyoshi, Y. (1982) Nonlinear high resolution image processing of conventional transmission electron micrographs. Ultramicroscopy, 9 (1). 65-74 doi:10.1016/0304-3991(82)90229-7 |
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In | (1982, January) Ultramicroscopy Vol. 9 (1) Elsevier BV |
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