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Lyman, C.E., Stenger, H.G., Michael, J.R. (1987) Analytical electron microscopy of a sulfur-poisoned palladium catalyst with a dedicated stem. Ultramicroscopy, 22 (1). 129-133 doi:10.1016/0304-3991(87)90057-x

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Reference TypeJournal (article/letter/editorial)
TitleAnalytical electron microscopy of a sulfur-poisoned palladium catalyst with a dedicated stem
JournalUltramicroscopy
AuthorsLyman, C.E.Author
Stenger, H.G.Author
Michael, J.R.Author
Year1987 (January)Volume22
Issue1
PublisherElsevier BV
DOIdoi:10.1016/0304-3991(87)90057-xSearch in ResearchGate
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Mindat Ref. ID4893448Long-form Identifiermindat:1:5:4893448:4
GUID0
Full ReferenceLyman, C.E., Stenger, H.G., Michael, J.R. (1987) Analytical electron microscopy of a sulfur-poisoned palladium catalyst with a dedicated stem. Ultramicroscopy, 22 (1). 129-133 doi:10.1016/0304-3991(87)90057-x
Plain TextLyman, C.E., Stenger, H.G., Michael, J.R. (1987) Analytical electron microscopy of a sulfur-poisoned palladium catalyst with a dedicated stem. Ultramicroscopy, 22 (1). 129-133 doi:10.1016/0304-3991(87)90057-x
In(1987, January) Ultramicroscopy Vol. 22 (1) Elsevier BV

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Lyman, C.E. (1982) Electron microscopy of surfaces and catalysts. Ultramicroscopy, 8 (1). 133-135 doi:10.1016/0304-3991(82)90282-0
Lyman, C.E., Hepburn, J.S., Stenger, H.G. (1990) Quantitative Pt and Rh distributions in pollution-control catalysts. Ultramicroscopy, 34 (1). 73-80 doi:10.1016/0304-3991(90)90060-y
Lyman, C.E., Garratt-Reed, A.J. (1981) Catalyst research using stem. Ultramicroscopy, 7 (1). 109pp. doi:10.1016/0304-3991(81)90046-2
Lyman, C.E., Lakis, R.E., Stenger, H.G. (1995) X-ray emission spectrometry of phase separation in PtRh nanoparticles for nitric oxide reduction. Ultramicroscopy, 58 (1). 25-34 doi:10.1016/0304-3991(94)00175-m
Rightor, Edward G., Pinnavaia, Thomas J. (1987) Stem studies of ruthenium dispersed on a pillared clay Fischer-Tropsch catalyst. Ultramicroscopy, 22 (1). 159-173 doi:10.1016/0304-3991(87)90060-x
(1987) Editorial Board. Ultramicroscopy, 22 (1). doi:10.1016/0304-3991(87)90043-x
Mankos, Marian, Higgs, A.A., Scheinfein, M.R., Cowley, J.M. (1995) Far-out-of-focus electron holography in a dedicated FEG STEM. Ultramicroscopy, 58 (1). 87-96 doi:10.1016/0304-3991(94)00181-l
Merkle, K.L., Smith, David J. (1987) Atomic resolution electron microscopy of NiO grain boudaries. Ultramicroscopy, 22 (1). 57-70 doi:10.1016/0304-3991(87)90050-7
Miyazawa, K., Ishida, Y. (1987) Weak-beam α-fringe electron microscopy of interface structures. Ultramicroscopy, 22 (1). 231-238 doi:10.1016/0304-3991(87)90067-2
Dravid, Vinayak P., Lyman, C.E., Notis, M.R., Revcolevschi, A. (1989) High resolution transmission electron microscopy of interphase interfaces in NiO-ZrO2(CaO). Ultramicroscopy, 29 (1). 60-70 doi:10.1016/0304-3991(89)90231-3
Krakow, William, Smith, David A. (1987) A high-resolution electron microscopy investigation of some low-angle and twin boundary structures. Ultramicroscopy, 22 (1). 47-55 doi:10.1016/0304-3991(87)90049-0
 
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