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Merkle, Karl L. (1991) High-resolution electron microscopy of interfaces in fcc materials. Ultramicroscopy, 37 (1). 130-152 doi:10.1016/0304-3991(91)90013-v

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Reference TypeJournal (article/letter/editorial)
TitleHigh-resolution electron microscopy of interfaces in fcc materials
JournalUltramicroscopy
AuthorsMerkle, Karl L.Author
Year1991 (August)Volume37
Issue1
PublisherElsevier BV
DOIdoi:10.1016/0304-3991(91)90013-vSearch in ResearchGate
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Mindat Ref. ID4895890Long-form Identifiermindat:1:5:4895890:7
GUID0
Full ReferenceMerkle, Karl L. (1991) High-resolution electron microscopy of interfaces in fcc materials. Ultramicroscopy, 37 (1). 130-152 doi:10.1016/0304-3991(91)90013-v
Plain TextMerkle, Karl L. (1991) High-resolution electron microscopy of interfaces in fcc materials. Ultramicroscopy, 37 (1). 130-152 doi:10.1016/0304-3991(91)90013-v
In(1991, August) Ultramicroscopy Vol. 37 (1) Elsevier BV

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Merkle, Karl L. (1992) Quantification of atomic-scale grain boundary parameters by high-resolution electron microscopy. Ultramicroscopy, 40 (3). 281-290 doi:10.1016/0304-3991(92)90125-4
Joy, David C. (1991) The theory and practice of high-resolution scanning electron microscopy. Ultramicroscopy, 37 (1). 216-233 doi:10.1016/0304-3991(91)90020-7
Hirsch, P.B. (1991) Frontiers of electron microscopy in materials science. Ultramicroscopy, 37 (1). 1-13 doi:10.1016/0304-3991(91)90003-o
Luzzi, D.E. (1991) High-resolution electron microscopy observations of faceted grain boundaries and twins in bismuth-doped copper. Ultramicroscopy, 37 (1). 180-190 doi:10.1016/0304-3991(91)90016-y
Hu, J.J., Li, F.H. (1991) Maximum entropy image deconvolution in high resolution electron microscopy. Ultramicroscopy, 35 (3). 339-350 doi:10.1016/0304-3991(91)90086-l
Smith, David J., Li, Z.G., Lu, Ping, McCartney, M.R., Tsen, S.-C.Y. (1991) Characterization of thin films, interfaces and surfaces by high-resolution electron microscopy. Ultramicroscopy, 37 (1). 169-179 doi:10.1016/0304-3991(91)90015-x
Bradley, S.A., Targos, W.M. (1991) Analytical electron microscopy of catalytic materials. Ultramicroscopy, 37 (1). 210-215 doi:10.1016/0304-3991(91)90019-3
O'Keefe, Michael A. (1992) “Resolution” in high-resolution electron microscopy. Ultramicroscopy, 47 (1). 282-297 doi:10.1016/0304-3991(92)90203-v
Tonner, Brian P. (1991) Photoelectron holography for high-resolution spectromicroscopy. Ultramicroscopy, 36 (1). 130-141 doi:10.1016/0304-3991(91)90144-u
Allard, L.F., Datye, A.K., Nolan, T.A., Mahan, S.L., Paine, R.T. (1991) High-resolution electron microscopy of BN on MgO: A model ceramic-ceramic interface. Ultramicroscopy, 37 (1). 153-168 doi:10.1016/0304-3991(91)90014-w
Merkle, K.L., Smith, David J. (1987) Atomic resolution electron microscopy of NiO grain boudaries. Ultramicroscopy, 22 (1). 57-70 doi:10.1016/0304-3991(87)90050-7
 
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