Oshima, R., Hua, G.C. (1991) Characterization of Czochralski Si crystals by HVEM. Ultramicroscopy, 39 (1). 160-170 doi:10.1016/0304-3991(91)90194-b

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Reference Type	Journal (article/letter/editorial)
Title	Characterization of Czochralski Si crystals by HVEM
Journal	Ultramicroscopy
Authors	Oshima, R.		Author
Authors	Hua, G.C.		Author
Year	1991 (November)	Volume	39
Issue	1
Publisher	Elsevier BV
DOI	doi:10.1016/0304-3991(91)90194-bSearch in ResearchGate
	Generate Citation Formats
Mindat Ref. ID	4896076	Long-form Identifier	mindat:1:5:4896076:2
GUID	0
Full Reference	Oshima, R., Hua, G.C. (1991) Characterization of Czochralski Si crystals by HVEM. Ultramicroscopy, 39 (1). 160-170 doi:10.1016/0304-3991(91)90194-b
Plain Text	Oshima, R., Hua, G.C. (1991) Characterization of Czochralski Si crystals by HVEM. Ultramicroscopy, 39 (1). 160-170 doi:10.1016/0304-3991(91)90194-b
In	(1991, November) Ultramicroscopy Vol. 39 (1) Elsevier BV

	*Tanaka, N., Kimoto, K., Mihama, K. (1991) Observations by HVEM of atomic clusters embedded in MgO crystals. Ultramicroscopy, 39 (1). 395-402 doi:10.1016/0304-3991(91)90220-z*
	*Jouffrey, Bernard (1991) Recent evolution of HVEM in France. Ultramicroscopy, 39 (1). 21-31 doi:10.1016/0304-3991(91)90178-9*
	*Van Landuyt, J. (1991) The evolution of HVEM application in Antwerp. Ultramicroscopy, 39 (1). 287-298 doi:10.1016/0304-3991(91)90208-n*
	*Goringe, M.J. (1991) Some aspects of HVEM in the study of materials. Ultramicroscopy, 39 (1). 100-104 doi:10.1016/0304-3991(91)90188-c*
	*Saka, H., Teshima, H. (1991) Recent progress in in-situ deformation experiments in HVEM. Ultramicroscopy, 39 (1). 81-85 doi:10.1016/0304-3991(91)90185-9*
	*(1991) Subject index to volume 39. Ultramicroscopy, 39 (1). 406-408 doi:10.1016/0304-3991(91)90222-r*
	*(1991) Editorial Board. Ultramicroscopy, 39 (1). doi:10.1016/0304-3991(91)90174-5*
	*Ezawa, Tadashi, Wakai, Eiichi (1991) Radiation-induced solute segregation in Al and Ni binary alloys under HVEM irradiation. Ultramicroscopy, 39 (1). 187-196 doi:10.1016/0304-3991(91)90197-e*
	*Okabayashi, H., Tanikawa, A., Mori, H., Fujita, H. (1991) HVEM observations of stress-induced voiding in Al lines for LSI. Ultramicroscopy, 39 (1). 306-312 doi:10.1016/0304-3991(91)90210-w*
	*(1991) Author index to volume 39. Ultramicroscopy, 39 (1). 403-405 doi:10.1016/0304-3991(91)90221-q*
	*(1991) Editorial Board. Ultramicroscopy, 36 (1). doi:10.1016/0304-3991(91)90134-r*

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Oshima, R., Hua, G.C. (1991) Characterization of Czochralski Si crystals by HVEM. Ultramicroscopy, 39 (1). 160-170 doi:10.1016/0304-3991(91)90194-b

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