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(1998, March) Ultramicroscopy Vol. 71 (1) Elsevier BV

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Reference TypeJournal (issue)
JournalUltramicroscopy
Year1998 (March)Volume71
Issue1
PublisherElsevier BV
Mindat Ref. ID4899319Long-form Identifiermindat:1:5:4899319:5
GUID0
Full Reference(1998, March) Ultramicroscopy Vol. 71 (1) Elsevier BV
Plain Text(1998, March) Ultramicroscopy Vol. 71 (1) Elsevier BV
In(1998) Ultramicroscopy Vol. 71. Elsevier BV

Contains

Keller, Ole (1998) Towards a microscopic theory of spatial confinement of light. Ultramicroscopy, 71 (1). 1-9 doi:10.1016/s0304-3991(97)00060-0
Van Labeke, Daniel, Vigoureux, Jean-Marie, Parent, Gilles (1998) Photon tunneling time. Ultramicroscopy, 71 (1). 11-20 doi:10.1016/s0304-3991(97)00061-2
Novotny, Lukas, Sánchez, Erik J., Sunney Xie, X. (1998) Near-field optical imaging using metal tips illuminated by higher-order Hermite–Gaussian beams. Ultramicroscopy, 71 (1). 21-29 doi:10.1016/s0304-3991(97)00077-6
Band, Y.B., Trippenbach, M., Bryant, Garnett W., Julienne, P.S. (1998) Probing evanescent modes from near-field optical microscopes:. Ultramicroscopy, 71 (1). 31-38 doi:10.1016/s0304-3991(97)00104-6
Valle, Pedro J., Carminati, RĂ©mi, Greffet, Jean-Jacques (1998) Contrast mechanisms in illumination-mode SNOM. Ultramicroscopy, 71 (1). 39-48 doi:10.1016/s0304-3991(97)00115-0
Castiaux, A, Girard, Ch, Spajer, M, Davy, S (1998) Near-field optical effects inside a photosensitive sample coupled with a SNOM tip. Ultramicroscopy, 71 (1). 49-58 doi:10.1016/s0304-3991(97)00096-x
Sayah, A, Philipona, C, Lambelet, P, Pfeffer, M, Marquis-Weible, F (1998) Fiber tips for scanning near-field optical microscopy fabricated by normal and reverse etching. Ultramicroscopy, 71 (1). 59-63 doi:10.1016/s0304-3991(97)00106-x
Madsen, S, Holme, N.C.R, Ramanujam, P.S, Hvilsted, S, Hvam, J.M, Smith, S.J (1998) Optimizing the fabrication of aluminum-coated fiber probes and their application to optical near-field lithography. Ultramicroscopy, 71 (1). 65-71 doi:10.1016/s0304-3991(97)00095-8
Muramatsu, Hiroshi, Chiba, Norio, Yamamoto, Noritaka, Homma, Katsunori, Ataka, Tatsuaki, Shigeno, Masatsugu, Monobe, Hirosato, Fujihira, Masamichi (1998) Multi-functional SNOM/AFM probe with accurately controlled low spring constant. Ultramicroscopy, 71 (1). 73-79 doi:10.1016/s0304-3991(97)00112-5
Castagne, M, Belier, B, Gall, P, Benfedda, M, Seassal, C, Spisser, A, Leclerc, J.L, Viktorovich, P (1998) New optical probes using InP-based cantilevers. Ultramicroscopy, 71 (1). 81-84 doi:10.1016/s0304-3991(97)00113-7
Oesterschulze, E, Rudow, O, Mihalcea, C, Scholz, W, Werner, S (1998) Cantilever probes for SNOM applications with single and double aperture tips. Ultramicroscopy, 71 (1). 85-92 doi:10.1016/s0304-3991(97)00089-2
Abraham, Michael, Ehrfeld, W, Lacher, Manfred, Mayr, Karsten, Wilfried Noell, , GĂĽthner, Peter, Barenz, J (1998) Micromachined aperture probe tip for multifunctional scanning probe microscopy. Ultramicroscopy, 71 (1). 93-98 doi:10.1016/s0304-3991(97)00114-9
Heisig, S, Danzebrink, H.-U, Leyk, A, Mertin, W, MĂĽnster, S, Oesterschulze, E (1998) Monolithic gallium arsenide cantilever for scanning near-field microscopy. Ultramicroscopy, 71 (1). 99-105 doi:10.1016/s0304-3991(97)00118-6
Stürmer, Herbert, Michael Köhler, J, M. Jovin, Thomas (1998) Microstructured polymer tips for scanning near-field optical microscopy. Ultramicroscopy, 71 (1). 107-110 doi:10.1016/s0304-3991(97)00097-1
Kossakovski, D.A, O'Connor, S.D, Widmer, M, Baldeschwieler, J.D, Beauchamp, J.L (1998) Spatially resolved chemical analysis with an NSOM-based laser desorption microprobe. Ultramicroscopy, 71 (1). 111-115 doi:10.1016/s0304-3991(97)00054-5
Lambelet, P, Pfeffer, M, Sayah, A, Marquis-Weible, F (1998) Reduction of tip–sample interaction forces for scanning near-field optical microscopy in a liquid environment. Ultramicroscopy, 71 (1). 117-121 doi:10.1016/s0304-3991(97)00055-7
Kramer, A, Hartmann, T, Eschrich, R, Guckenberger, R (1998) Scanning near-field fluorescence microscopy of thin organic films at the water/air interface. Ultramicroscopy, 71 (1). 123-132 doi:10.1016/s0304-3991(97)00056-9
Golosovsky, M, Lann, A, Davidov, D (1998) A millimeter-wave near-field scanning probe with an optical distance control. Ultramicroscopy, 71 (1). 133-141 doi:10.1016/s0304-3991(97)00058-2
Hollricher, O, Brunner, R, Marti, O (1998) Piezoelectrical shear-force distance control in near-field optical microscopy for biological applications. Ultramicroscopy, 71 (1). 143-147 doi:10.1016/s0304-3991(97)00074-0
Ruiter, A.G.T., van der Werf, K.O., Veerman, J.A., Garcia-Parajo, M.F., Rensen, W.H.J., van Hulst, N.F. (1998) Tuning fork shear-force feedback. Ultramicroscopy, 71 (1). 149-157 doi:10.1016/s0304-3991(97)00111-3
Wei, P.K., Fann, W.S. (1998) Determination of the shear force magnitude in near-field scanning optical microscopy. Ultramicroscopy, 71 (1). 159-163 doi:10.1016/s0304-3991(97)00063-6
Williamson, R.L, Brereton, L.J, Antognozzi, M, Miles, M.J (1998) Are artefacts in scanning near-field optical microscopy related to the misuse of shear force?. Ultramicroscopy, 71 (1). 165-175 doi:10.1016/s0304-3991(97)00078-8
Smolyaninov, Igor I., Atia, Walid A., Pilevar, Saeed, Davis, Christopher C. (1998) Experimental study of probe–surface interaction in near-field optical microscopy. Ultramicroscopy, 71 (1). 177-182 doi:10.1016/s0304-3991(97)00098-3
Merritt, G, Monson, E, Betzig, E, Kopelman, R (1998) A compact near-field scanning optical microscope. Ultramicroscopy, 71 (1). 183-189 doi:10.1016/s0304-3991(97)00057-0
Kazantsev, D.V. (1998) A simple scanning head for scanning near-field optical microscope. Ultramicroscopy, 71 (1). 191-198 doi:10.1016/s0304-3991(97)00117-4
Tománek, Pavel, Brüstlová, Jitka, Dobis, Pavel, Grmela, Lubomir (1998) Hybrid STM/R-SNOM with novel probe. Ultramicroscopy, 71 (1). 199-203 doi:10.1016/s0304-3991(97)00119-8
Richter, A, Süptitz, M, Lienau, Ch, Elsaesser, T, Ramsteiner, M, Nötzel, R, Ploog, K.H (1998) Carrier trapping into single GaAs quantum wires studied by variable temperature near-field spectroscopy. Ultramicroscopy, 71 (1). 205-212 doi:10.1016/s0304-3991(97)00073-9
Smith, Steve, Holme, Niels Christian Roemer, Orr, Brad, Kopelman, Raoul, Norris, Ted (1998) Ultrafast measurement in GaAs thin films using NSOM. Ultramicroscopy, 71 (1). 213-223 doi:10.1016/s0304-3991(97)00062-4
Shen, Yao-Chun, Hess, Peter (1998) Intensity distribution of light emitted from a fiber tip mapped by short surface acoustic wave pulses. Ultramicroscopy, 71 (1). 225-229 doi:10.1016/s0304-3991(97)00076-4
Gall-Borrut, P., Castagne, M., Weyher, J.L., Fillard, J.P., Bonnafe, J. (1998) A study of semiconductor surfaces and devices by coupled IR photon tunneling and atomic-force microscopy. Ultramicroscopy, 71 (1). 231-234 doi:10.1016/s0304-3991(97)00079-x
Kazantsev, D.V, Gippius, N.A, Oshinowo, J, Forchel, A (1998) Direct measurement of photoluminescence spatial distribution near the GaAs/AlGaAs quantum well edge using a scanning near-field optical microscope. Ultramicroscopy, 71 (1). 235-241 doi:10.1016/s0304-3991(97)00116-2
Matthes, Frank, BrĂĽckl, Hubert, Reiss, GĂĽnter (1998) Near-field magneto-optical microscopy in collection and illumination mode. Ultramicroscopy, 71 (1). 243-248 doi:10.1016/s0304-3991(97)00094-6
Eggers, Georg, Rosenberger, Andreas, Held, Nicole, MĂĽnnemann, Ansgar, GĂĽntherodt, Gernot, Fumagalli, Paul (1998) Scanning near-field magneto-optic microscopy using illuminated fiber tips. Ultramicroscopy, 71 (1). 249-256 doi:10.1016/s0304-3991(97)00099-5
Nakajima, Kunio, Mitsuoka, Yasuyuki, Chiba, Norio, Muramatsu, Hiroshi, Ataka, Tatsuaki, Sato, Katsuaki, Fujihira, Masamichi (1998) Polarization effect in scanning near-field optic/atomic-force microscopy (SNOM/AFM). Ultramicroscopy, 71 (1). 257-262 doi:10.1016/s0304-3991(97)00100-9
Hsu, J.H., Wei, P.K., Fann, W.S., Chuang, K.R., Chen, S.A. (1998) The inhomogeneity in conjugated polymer blend films. Ultramicroscopy, 71 (1). 263-267 doi:10.1016/s0304-3991(97)00087-9
Fujihira, M, Monobe, H, Koike, A, Ivanov, G.R, Muramatsu, H, Chiba, N, Yamamoto, N, Ataka, T (1998) Application of scanning near-field optical microscopy to thin organic film devices. Ultramicroscopy, 71 (1). 269-274 doi:10.1016/s0304-3991(97)00105-8
Webster, S., Smith, D.A., Batchelder, D.N., Lidzey, D.G., Bradley, D.D.C. (1998) Application of fluorescence scanning near-field optical microscopy to the study of phase-separated conjugated polymers. Ultramicroscopy, 71 (1). 275-279 doi:10.1016/s0304-3991(97)00088-0
Nagahara, L.A., Nakamura, M., Tokumoto, H. (1998) Investigation of mesoscopic domains in thin organic films using near-field optical absorption mapping. Ultramicroscopy, 71 (1). 281-285 doi:10.1016/s0304-3991(97)00092-2
Monobe, H., Koike, A., Muramatsu, H., Chiba, N., Yamamoto, N., Ataka, T., Fujihira, M. (1998) Scanning near-field fluorescence microscopy of a phase-separated hydrocarbon–fluorocarbon mixed monolayer. Ultramicroscopy, 71 (1). 287-293 doi:10.1016/s0304-3991(97)00065-x
Kirsch, A.K, Meyer, C.K, Huesmann, H, Möbius, D, Jovin, T.M (1998) Fluorescence SNOM of domain structures of LB films containing electron transfer systems. Ultramicroscopy, 71 (1). 295-302 doi:10.1016/s0304-3991(97)00059-4
Enderle, Th., Ha, T., Chemla, D.S., Weiss, S. (1998) Near-field fluorescence microscopy of cells. Ultramicroscopy, 71 (1). 303-309 doi:10.1016/s0304-3991(97)00075-2
Garcia-Parajo, M.F., Veerman, J.-A., Ruiter, A.G.T., van Hulst, N.F. (1998) Near-field optical and shear-force microscopy of single fluorophores and DNA molecules. Ultramicroscopy, 71 (1). 311-319 doi:10.1016/s0304-3991(97)00086-7
Ben-Ami, Nily, Radko, Anna, Ben-Ami, Udi, Lieberman, Klony, Rothman, Zvi, Rabin, Itzhak, Lewis, Aaron (1998) Near-field optical imaging of unstained bacteria: comparison with normal atomic force and far-field optical microscopy in air and aqueous media. Ultramicroscopy, 71 (1). 321-325 doi:10.1016/s0304-3991(97)00110-1
Adam, P.M., Royer, P., Laddada, R., Bijeon, J.L. (1998) Polarization contrast with an apertureless near-field optical microscope. Ultramicroscopy, 71 (1). 327-331 doi:10.1016/s0304-3991(97)00091-0
Lacoste, Th., Huser, Th., Prioli, R., Heinzelmann, H. (1998) Contrast enhancement using polarization-modulation scanning near-field optical microscopy (PM-SNOM). Ultramicroscopy, 71 (1). 333-340 doi:10.1016/s0304-3991(97)00093-4
Novotny, Lukas, Hecht, Bert, Pohl, Dieter W. (1998) Implications of high resolution to near-field optical microscopy. Ultramicroscopy, 71 (1). 341-344 doi:10.1016/s0304-3991(97)00066-1
Boneberg, J., Ochmann, M., MĂĽnzer, H.-J., Leiderer, P. (1998) An approach to spectroscopy and phase measurements in scanning plasmon near-field microscopy. Ultramicroscopy, 71 (1). 345-350 doi:10.1016/s0304-3991(97)00064-8
Van Labeke, Daniel, Issam Baida, Fadi, Vigoureux, Jean-Marie (1998) A theoretical study of near-field detection and excitation of surface plasmons. Ultramicroscopy, 71 (1). 351-359 doi:10.1016/s0304-3991(97)00067-3
Barchiesi, Dominique, Bergossi, Olivier, Pieralli, Christian, Spajer, Michel (1998) Reflection scanning near-field optical microscopy (R-SNOM) in constant height mode with a dielectric probe Image interpretation and resolution for high topographic variations. Ultramicroscopy, 71 (1). 361-370 doi:10.1016/s0304-3991(97)00068-5
Danzebrink, Hans U., Castiaux, Annick, Girard, Christian, Bouju, Xavier, Wilkening, GĂĽnter (1998) Transmission scanning near-field optical microscopy with uncoated silicon tips. Ultramicroscopy, 71 (1). 371-377 doi:10.1016/s0304-3991(97)00101-0
Atia, Walid A., Pilevear, Saeed, Güngör, Ali, Davis, Christopher C. (1998) On the spatial resolution of uncoated optical-fiber probes in internal reflection near-field scanning optical microscopy. Ultramicroscopy, 71 (1). 379-382 doi:10.1016/s0304-3991(97)00090-9
Kaupp, G, Herrmann, A (1998) Positive submicron lithography using uncoated or far-field apertured SNOM tips on organic crystals. Ultramicroscopy, 71 (1). 383-388 doi:10.1016/s0304-3991(97)00072-7
(1998) Index. Ultramicroscopy, 71 (1). 389-392 doi:10.1016/s0304-3991(98)00012-6
(1998) Index. Ultramicroscopy, 71 (1). 395-398 doi:10.1016/s0304-3991(98)00014-x

See Also

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