Reference Type | Journal (article/letter/editorial) |
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Title | Detection of infrared photons using the electronic stress in metal–semiconductor cantilever interfaces |
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Journal | Ultramicroscopy |
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Authors | Datskos, P.G. | Author |
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Rajic, S. | Author |
Datskou, I. | Author |
Year | 2000 (February) | Volume | 82 |
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Issue | 1 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/s0304-3991(99)00140-0Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 4900105 | Long-form Identifier | mindat:1:5:4900105:7 |
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GUID | 0 |
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Full Reference | Datskos, P.G., Rajic, S., Datskou, I. (2000) Detection of infrared photons using the electronic stress in metal–semiconductor cantilever interfaces. Ultramicroscopy, 82 (1). 49-56 doi:10.1016/s0304-3991(99)00140-0 |
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Plain Text | Datskos, P.G., Rajic, S., Datskou, I. (2000) Detection of infrared photons using the electronic stress in metal–semiconductor cantilever interfaces. Ultramicroscopy, 82 (1). 49-56 doi:10.1016/s0304-3991(99)00140-0 |
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In | (2000, February) Ultramicroscopy Vol. 82 (1) Elsevier BV |
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