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Mitsuishi, K, Kawasaki, M, Takeguchi, M, Yasuda, H, Furuya, K (2001) High-angle annular dark-field STEM observation of Xe nanocrystals embedded in Al. Ultramicroscopy, 88 (1). 25-31 doi:10.1016/s0304-3991(00)00114-5

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Reference TypeJournal (article/letter/editorial)
TitleHigh-angle annular dark-field STEM observation of Xe nanocrystals embedded in Al
JournalUltramicroscopy
AuthorsMitsuishi, KAuthor
Kawasaki, MAuthor
Takeguchi, MAuthor
Yasuda, HAuthor
Furuya, KAuthor
Year2001 (June)Volume88
Issue1
PublisherElsevier BV
DOIdoi:10.1016/s0304-3991(00)00114-5Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4900497Long-form Identifiermindat:1:5:4900497:5
GUID0
Full ReferenceMitsuishi, K, Kawasaki, M, Takeguchi, M, Yasuda, H, Furuya, K (2001) High-angle annular dark-field STEM observation of Xe nanocrystals embedded in Al. Ultramicroscopy, 88 (1). 25-31 doi:10.1016/s0304-3991(00)00114-5
Plain TextMitsuishi, K, Kawasaki, M, Takeguchi, M, Yasuda, H, Furuya, K (2001) High-angle annular dark-field STEM observation of Xe nanocrystals embedded in Al. Ultramicroscopy, 88 (1). 25-31 doi:10.1016/s0304-3991(00)00114-5
In(2001, June) Ultramicroscopy Vol. 88 (1) Elsevier BV

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Mitsuishi, K., Takeguchi, M., Yasuda, H., Furuya, K. (2001) New scheme of calculation of annular dark-field STEM image including both elastically diffracted and TDS waves. Microscopy, 50 (3). 157-162 doi:10.1093/jmicro/50.3.157
Mitsuishi, K., Takeguchi, M., Toda, Y., Furuya, K. (2003) Layer-doubling method in ADF-STEM image simulation. Ultramicroscopy, 96 (3). 323-333 doi:10.1016/s0304-3991(03)00097-4
Yamazaki, T, Kawasaki, M, Watanabe, K, Hashimoto, I, Shiojiri, M (2002) Effect of small crystal tilt on atomic-resolution high-angle annular dark field STEM imaging. Ultramicroscopy, 92 (3). 181-189 doi:10.1016/s0304-3991(02)00131-6
Mitsuishi, K., Kawasaki, M., Takeguchi, M., Furuya, K. (1999) Determination of Atomic Positions in a Solid Xe Precipitate Embedded in an Al Matrix. Physical Review Letters, 82 (15). 3082-3084 doi:10.1103/physrevlett.82.3082
Liu, Chuan-Pu, Twesten, R.D., Gibson, J.Murray (2001) High-angle annular dark-field imaging of self-assembled Ge islands on Si(001). Ultramicroscopy, 87 (1). 79-88 doi:10.1016/s0304-3991(00)00059-0
Mitsuishi, K., Hashimoto, A., Takeguchi, M., Shimojo, M., Ishizuka, K. (2010) Imaging properties of bright-field and annular-dark-field scanning confocal electron microscopy. Ultramicroscopy, 111 (1). 20-26 doi:10.1016/j.ultramic.2010.08.004
Song, M., Mitsuishi, K., Furuya, K. (2004) Observation of Nanometer-Xe Clusters Embedded in Al Crystals. Microscopy and Microanalysis, 10 (1). 122-127 doi:10.1017/s1431927604040243
Mitsuishi, K., Song, M., Furuya, K. (1999) The displacement observation of solid Xe precipitates embedded in Al using HRTEM. Journal of Electron Microscopy, 48 (5). 591-594 doi:10.1093/oxfordjournals.jmicro.a023721
Mitsuishi, K., Hashimoto, A., Takeguchi, M., Shimojo, M., Ishizuka, K. (2012) Imaging properties of bright-field and annular-dark-field scanning confocal electron microscopy: II. Point spread function analysis. Ultramicroscopy, 112 (1). 53-60 doi:10.1016/j.ultramic.2011.10.004
Mitsuishi, K, Song, M, Yasuda, H, Furuya, K (2001) Effect of Ar irradiation to Xe precipitate in Al. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 175. 74-77 doi:10.1016/s0168-583x(00)00575-9
Kirkland, Earl J., Thomas, Malcolm G. (1996) A high efficiency annular dark field detector for STEM. Ultramicroscopy, 62 (1). 79-88 doi:10.1016/0304-3991(95)00092-5
 
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